category: Test, Measurement and Analytics

category: IoT, Security & Automotive

Expanding The Horizon Of System Monitoring With The Arm SMCF
By Ziv Paz - 14 Jan, 2025 - Comments: 0

In an era where system complexity is scaling rapidly, real-time monitoring and predictive analytics play a pivotal role in maintaining lifetime performance and reliability. At proteanTecs, we are committed to enabling advanced diagnostics, predictive maintenance, and on-chip actionable visibility for today’s mission-critical systems, across high-performance industries. Our in-chip monitori... » read more

Experiences Estimating Test Quality And Test Escape Rates
By Ken Butler - 14 Jan, 2025 - Comments: 0

When discussing product quality in integrated circuits (ICs), two key aspects are essential: time zero defects and reliability. These concepts help distinguish between issues that appear immediately after manufacturing and those that occur over time. Understanding these distinctions is critical for ensuring that products meet the quality demands of their respective markets, particularly in h... » read more

Streaming Scan Network
By Siemens EDA - 14 Jan, 2025 - Comments: 0

Tessent Streaming Scan Network (SSN) is a system for packetized delivery of scan test patterns. It enables simultaneous testing of any number of cores with few chip-level pins, and reduces test time and test data volume. With SSN, DFT engineers have a true SoC DFT solution without compromises between implementation effort and manufacturing test cost. Challenges with DFT for complex SoCs The... » read more

No-Compromise Packetized Test Improves DFT Efforts
By Peter Orlando - 14 Jan, 2025 - Comments: 0

Design for Test (DFT) managers often must make difficult and sometimes costly trade-offs between test implementation effort and manufacturing test cost. The traditional method for evaluating these trade-offs has been to use hierarchical DFT methods in a divide-and-conquer approach. In hierarchical DFT efforts, all implementation, including pattern generation and verification, is done at the cor... » read more

DFT At The Leading Edge
By Gregory Haley - 14 Jan, 2025 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss the rapidly changing landscape of design for testability (DFT), focusing on the impact of advancements in fault models, high-speed interfaces, and lifecycle data analytics, with Jeorge Hurtarte, senior director of product marketing in the Semiconductor Test Group at Teradyne; Sri Ganta, director of test products at Synopsys; D... » read more

Shortcutting Graduates’ Path To Productivity In Manufacturing And Test
By Liz Allan - 16 Dec, 2024 - Comments: 1

Manufacturing, test, assembly, and analytics companies are finding unique ways to engage with universities in an effort to shore up the talent pipeline. The industry is recruiting graduates from universities across the U.S. while partnering with local institutes to serve specific needs. Industry/university co-operation includes: Mapping job descriptions Providing curricula frameworks... » read more

Why Chips Fail, And What To Do About It
By Ed Sperling - 11 Dec, 2024 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to discuss reliability of chips in the context of safety- and mission-critical systems, as well as increasing utilization due to an explosion in AI data, with Steve Pateras, vice president of marketing and business development at Synopsys; Noam Brousard, vice president of solutions engineering at proteanTecs; Harry Foster, chief verificat... » read more

Semiconductor Test Faces Technology Shifts In The AI Era
By Jeorge Hurtarte - 10 Dec, 2024 - Comments: 0

The surge in data-rich applications shows no signs of slowing down, fueling significant evolution within the global semiconductor industry. This insatiable demand for data necessitates a comprehensive ecosystem involving sensors and systems to capture data, networks to transmit it, and storage and processing power to analyze it. Successful deployment of these applications relies on the devel... » read more

Understanding Test Quality In Semiconductor Devices: An Overview
By Ken Butler - 10 Dec, 2024 - Comments: 0

When it comes to semiconductor device testing, the primary goal is to ensure that each device meets functional and performance specifications. Testing also plays a crucial role in confirming that products will work as intended in real-world applications. However, defects in the manufacturing process can be a hindrance, making testing an essential step for quality assurance. Why test matters: F... » read more

Shift Left Strategy For Semiconductor Production Testing
By Guy Gozlan - 10 Dec, 2024 - Comments: 0

In the fast-paced world of semiconductor manufacturing, achieving higher yields and reducing costs are constant challenges. Ideally, yield should only be impacted by unavoidable defects when everything else is performing as expected. However, when yield reduction occurs due to the process sensitivity of the design, these issues can be detected and, in many cases, corrected. proteanTecs has d... » read more

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