category: Test, Measurement and Analytics

category: IoT, Security & Automotive

Introduction to the PXI Architecture
By NI - 10 Sep, 2024 - Comments: 0

PXI systems provide high-performance modular instruments and other I/O modules with specialized synchronization and key software features for test and measurement applications from device validation to automated production test. For a high-level understanding of PXI, see the two images in Figure 1 that compare a PXI system’s chassis, controller, and PXI(e) peripheral modules to components of ... » read more

Real-Time Safety Monitoring
By Ed Sperling - 28 Aug, 2024 - Comments: 0

Various types of semiconductor test will determine whether a chip is free of defects and meets the specification, but understanding how it's behaving in the field under real workloads and harsh ambient conditions may be very different in automotive applications, where vibration, heat, cold can disrupt the normal functioning of a chip over time and reduce its lifespan. Alex Burlak, vice presiden... » read more

Bluetooth’s New Era: The Role Of Channel Sounding And Adaptable Testing Solutions
By Jake Harnack - 07 Aug, 2024 - Comments: 0

By Jake Harnack and Alejandro Escobar Calderon Bluetooth technology has experienced a remarkable transformation since its inception, evolving from a basic tool for data transfer to a near-ubiquitous wireless technology used for audio streaming, location services, and smart-home networks. As sales of Bluetooth-enabled devices nears 5 billion units per year in 2024, the Bluetooth standard is e... » read more

AI/ML’s Role In Design And Test Expands
By Laura Peters - 06 Aug, 2024 - Comments: 1

The role of AI and ML in test keeps growing, providing significant time and money savings that often exceed initial expectations. But it doesn't work in all cases, sometimes even disrupting well-tested process flows with questionable return on investment. One of the big attractions of AI is its ability to apply analytics to large data sets that are otherwise limited by human capabilities. In... » read more

Achieving Zero Defect Manufacturing Part 2: Finding Defect Sources
By Prasad Bachiraju - 06 Aug, 2024 - Comments: 1

Semiconductor manufacturing creates a wealth of data – from materials, products, factory subsystems and equipment. But how do we best utilize that information to optimize processes and reach the goal of zero defect manufacturing? This is a topic we first explored in our previous blog, “Achieving Zero Defect Manufacturing Part 1: Detect & Classify.” In it, we examined real-time defe... » read more

Are You Ready For HBM4? A Silicon Lifecycle Management (SLM) Perspective
By Faisal Goriawalla - 06 Aug, 2024 - Comments: 0

Many factors are driving system-on-chip (SoC) developers to adopt multi-die technology, in which multiple dies are stacked in a three-dimensional (3D) configuration. Multi-die systems may make power and thermal issues more complex, and they have required major innovations in electronic design automation (EDA) implementation and test tools. These challenges are more than offset by the advantages... » read more

Metrology And Inspection For The Chiplet Era
By Gregory Haley - 06 Aug, 2024 - Comments: 0

New developments and innovations in metrology and inspection will enable chipmakers to identify and address defects faster and with greater accuracy than ever before, all of which will be required at future process nodes and in densely packed assemblies of chiplets. These advances will affect both front-end and back-end processes, providing increased precision and efficiency, combined with a... » read more

Semiconductor Shifts In Automotive: Impact Of EV And ADAS Trends
By Fisher Zhang - 06 Aug, 2024 - Comments: 0

The integration of advanced driver assistance systems (ADAS) and the transition towards electric vehicles (EVs) are significantly transforming the automotive industry. Modern vehicles, essentially computers on wheels, require substantially more semiconductors. In response, carmakers are forming stronger partnerships with semiconductor vendors – some are taking a page from tech giants like ... » read more

Driving Cost Lower and Power Higher With GaN
By Anne Meixner - 06 Aug, 2024 - Comments: 0

Gallium nitride is starting to make broader inroads in the lower-end of the high-voltage, wide-bandgap power FET market, where silicon carbide has been the technology of choice. This shift is driven by lower costs and processes that are more compatible with bulk silicon. Efficiency, power density (size), and cost are the three major concerns in power electronics, and GaN can meet all three c... » read more

Leveraging AI To Efficiently Test AI Chips
By Ira Leventhal - 06 Aug, 2024 - Comments: 0

In the fast-paced world of technology, where innovation and efficiency are paramount, integrating artificial intelligence (AI) and machine learning (ML) into the semiconductor testing ecosystem has become of critical importance due to ongoing challenges with accuracy and reliability. AI and ML algorithms are used to identify patterns and anomalies that might not be discovered by human testers o... » read more

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