Smart Test Collides With The Data Chain


Key Takeaways: The promise of smart test is a data-chain problem before it is an algorithm problem. A device can pass every checkpoint and still carry a latent defect the test record never captured. As test grows more adaptive, the validity of the measurement environment matters as much as the measurement itself. For years, the test roadmap has pointed toward more adaptive f... » read more

HBM Shifts Testing Left To Preserve AI Chip Yield


Key Takeaways: A high-yield, known-good stack requires multiple test insertions. Known good stack testing poses challenges for power delivery and thermal management. The shift to HBM4 and HBM5 will increase the pressure for shift-left test flows. Taller high-bandwidth memory (HBM) stacks and tighter TSV pitch are impacting AI module yields. The solution is to push test furth... » read more

Debugging Modern SoCs With Embedded Analytics: Instrumentation, Trace, And Faster Root-Cause Isolation


As SoCs chase ever higher performance and power efficiency, their designs have become harder to rootcause and harder to debug. Today’s devices combine billions of transistors with heterogeneous compute blocks and a growing mix of third‑party IPs, so failures can come from anywhere: a corner-case interaction between cores, an integration mistake, a timing assumption that no longer holds, or ... » read more

Features And Benefits Of The SECS/GEM Standard – eBook


Discover how the SEMI E30 SECS/GEM standard empowers smarter, more efficient manufacturing by enabling factories to seamlessly collect equipment data, reduce integration costs, implement advanced process control, and improve overall operational performance. This eBook walks through key GEM capabilities—including collection events, alarms, recipe management, terminal services, and more—to s... » read more

System-in-Package Challenges


Systems companies and leading-edge chipmakers are pushing past reticle limits with chiplet-based designs, often breaking compute-intensive functions into different chiplets and coupling those with other chiplets that may have been developed by different teams and at different process nodes. This is harder than it sounds, and results can vary widely even under the best circumstances. Nir Sever, ... » read more

The Smart Advantage: How Artificial Intelligence Is Transforming Inspection And Metrology In Semiconductor Manufacturing


There is no doubt that the semiconductor industry is in an era of rapid and profound transformation, driven by an increasing demand for smaller, faster, and more powerful chips. As the speed of innovation continues to advance, so does the pressure on semiconductor manufacturers to detect and address defects and inconsistencies with near-perfect accuracy to keep pace with this demand. Manual ... » read more

Why Hardware Monitoring Needs Infrastructure, Not Just Sensors


Chipmakers need comprehensive hardware monitoring, with monitors (Agents) and sensors distributed throughout their devices, to manage the growing complexity and scale of modern SoCs. As designs now incorporate billions of transistors, multiple power and clock domains, and advanced process technologies, traditional characterization, test, and guard-banding approaches no longer provide sufficient... » read more

The Specialty Device Surge Part 2: The Process Control Challenges Of MEMS, Co-Packaged Optics, And More


In a world where high-bandwidth memory, GPUs, and advanced AI packages are all the rage, it is easy to forget the important role specialty devices play. These unsung heroes of modern life perform critical functions across a wide range of industries, including automotive, telecommunications, data centers, emerging AI hardware ecosystems, and consumer electronics, just like the smartphone in your... » read more

Breaking The Legacy Trap: How Semiconductor Executives Can Accelerate AI Adoption And Transform IT Applications At The Same Time


The semiconductor industry is facing a strategic paradox. AI has rapidly moved from experimental technology to a competitive necessity promising faster yield improvement, smarter supply chain decisions, and autonomous factory operations. Yet the very systems that semiconductor manufacturers depend on to run their fabs, manage their supply chains, and serve their customers were built for a diffe... » read more

Enhancing Silicon Reliability With In-System Test And SLM Data


Innovation in semiconductor development and manufacturing shows no signs of slowing down. Ever-larger chips at ever-smaller geometries create new challenges all the time. At the same time, competitive pressures are shrinking time to market (TTM) and putting enormous pressure on project teams. Furthermore, the wide use of electronics in safety-critical applications demands better reliability, av... » read more

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