Manufacturing Bits: May 4


Measuring Moon dust The National Institute of Standards and Technology (NIST) and others have developed a new way to study and measure moon dust. Using an X-ray nano computed tomography (XCT) technique, researchers measured the 3D shapes of lunar particles as small as 400nm in length. The goal is to find out how these shapes impact the optical scattering characteristics of lunar dust on the... » read more

Manufacturing Bits: April 27


Next-gen neuromorphic computing The European Union (EU) has launched a new project to develop next-generation devices for neuromorphic computing systems. The project, called MeM-Scales, plans to develop a novel class of algorithms, devices, and circuits that reproduce multi-timescale processing of biological neural systems. The results will be used to build neuromorphic computing systems th... » read more

Manufacturing Bits: April 20


SiC power semi R&D Earth Day, which supports environmental protection, takes place this week on April 22. Technology plays a big role in the environment. Governments, companies, R&D organizations and universities are developing a multitude of environmental-related technologies. In just one example, Swansea University has been awarded £4.8 million from the government of the Unite... » read more

Manufacturing Bits: April 13


Error-correction DNA storage Los Alamos National Laboratory has developed a key technology that could one day pave the way towards DNA storage. Researchers have developed a technology called the Adaptive DNA Storage Codec (ADS Codex). ADS Codex is software that translates digital binary files into the four-letter genetic alphabet needed for DNA storage. Deoxyribonucleic acid (DNA) is a m... » read more

Manufacturing Bits: April 5


Open access superconducting magnets The National High Magnetic Field Laboratory or MagLab has opened the world's strongest superconducting magnet to users. In the works for eight years, the 32 tesla (T) all-superconducting magnet enables scientists to conduct research for various applications, such as quantum matter experiments. The system is called the SCM-32 T. MagLab develops several ... » read more

Manufacturing Bits: March 30


Open access quantum computing Sandia National Laboratories has begun offering an open access program for its quantum computing testbed. Sandia will enable researchers to explore a range of new technologies, such as chemistry, materials science and mathematics, using its so-called Quantum Scientific Computing Open User Testbed (QSCOUT). Quantum computers promise to solve problems that are to... » read more

Manufacturing Bits: March 23


Measuring acceleration The National Institute of Standards and Technology (NIST) has developed a new and better way to measure acceleration. NIST has developed an optomechanical accelerometer, a technology that has more resolution and bandwidth than conventional accelerometers. Optomechanical accelerometers uses laser light of a known frequency to measure acceleration. With the technology, ... » read more

Manufacturing Bits: March 16


Tripping up neural networks For years, Russia has been an active area in R&D. In one example, Russia's Skolkovo Institute of Science and Technology (Skoltech) has demonstrated how certain patterns can cause neural networks to make mistakes in recognizing images. Leveraging the theory behind this research, Skoltech can design defenses for pattern recognition systems that are vulnerable t... » read more

Manufacturing Bits: March 8


Two-beam EUV lithography At the recent SPIE Advanced Lithography conference, Nikon gave a presentation on a two-beam extreme ultraviolet (EUV) lithography technology. Still in the conceptual phase, Nikon’s so-called EUV Projection Optical Wafer Exposure Ruling Machine, or EUV Power Machine, is designed for the 1nm node or so. The proposed system has a minimum resolution of 10nm for lines ... » read more

Manufacturing Bits: March 2


Next-gen AFM At the recent SPIE Advanced Lithography conference, Imec, Infinitesima and others described a new metrology tool technology called a Rapid Probe Microscope (RPM). Infinitesima has shipped its first RPM 3D system, enabling three-dimensional (3D) metrology applications for leading-edge chips. The system was jointly developed with Imec. In the IEDM paper, Imec and Infinitesima... » read more

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