Using Static Analysis For Functional Safety


Fadi Maamari, group director for R&D at Synopsys, explains why static analysis is suddenly in demand in auto chip design, how it can help to choose the best implementation of functional safety approaches, and where it fits into the design flow. » read more

3 Safety Standards For Auto Electronics


Kurt Shuler, vice president of marketing at Arteris IP, drills down into the three main safety standards, ISO 26262, SOTIF (Safety of the Intended Function) and UL 4600, what each one covers, what the intent is behind them, and what this means for companies developing technology for future vehicles. » read more

Bridging Math And Engineering In ML


Steve Roddy, vice president of products for Arm’s Machine Learning Group, examines the intersection of high-level mathematics in the data science used in machine learning within area, speed, and power limitations, and how to bring these two worlds together with the least amount of disruption. » read more

Scan Diagnosis


Jayant D’Souza, product manager at Mentor, a Siemens Business, explains the difference between scan test and scan diagnosis, what causes values in a scan test to change, how this can be used to hone in on the actual cause of a failure in a design, and how to utilize test hardware more efficiently. » read more

Testing Autonomous Vehicles


Jeff Phillips, head of automotive marketing at National Instruments, talks about how to ensure that automotive systems are reliable and safe, how test needs to shift to adapt to continual updates and changes, and why this is particularly challenging in a world where there is no known right answer. » read more

How To Ensure Reliability


Michael Schuldenfrei, corporate technology fellow at OptimalPlus, talks about how to measure quality, why it’s essential to understand all of the possible variables in the testing process, and why outliers are no longer considered sufficient to ensure reliability. » read more

MLPerf Benchmarks


Geoff Tate, CEO of Flex Logix, talks about the new MLPerf benchmark, what’s missing from the benchmark, and which ones are relevant to edge inferencing. » read more

Challenges In IP Reuse


Jeff Markham, software architect at ClioSoft, explains why IP reuse is so important in advanced process node SoC chip designs, what companies need to keep track of when working with third-party IP, and how it needs to be characterized. » read more

CXL Vs. CCIX


Kurt Shuler, vice president of marketing at ArterisIP, explains how these two standards differ, which one works best where, and what each was designed for. » read more

Distributed Design Implementation


PV Srinivas, group director for R&D at Synopsys, talks about the impact of larger chips and increasing complexity on design productivity, why divide-and-conquer doesn’t work so well anymore, and how to reduce the number of blocks that need to be considered to achieve faster timing closure and quicker time to market. » read more

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