category: Videos

category: IoT, Security & Automotive

Dealing With ECOs In Complex Designs
By Ed Sperling - 22 Jan, 2020 - Comments: 0

Namsuk Oh, R&D principal engineer at Synopsys, talks about the impact of more corners and engineering change orders, how that needs to be addressed in the flow to close timing, and how dependencies can complicate any changes that are required. » read more

Network Storage Optimization In Chip Design
By Ed Sperling - 21 Jan, 2020 - Comments: 0

Prathna Sekar, technical account manager at ClioSoft, explains how to manage large quantities of data, how this can quickly spin out of control as colleagues check in data during the design process, and how to reduce the amount that needs to be stored. » read more

How Chips Age
By Ed Sperling - 20 Jan, 2020 - Comments: 1

Andre Lange, group manager for quality and reliability at Fraunhofer IIS’ Engineering of Adaptive Systems Division, talks about circuit aging, whether current methods of predicting reliability are accurate for chips developed at advanced process nodes, and where additional research is needed. » read more

Using Static Analysis For Functional Safety
By Ed Sperling - 15 Jan, 2020 - Comments: 0

Fadi Maamari, group director for R&D at Synopsys, explains why static analysis is suddenly in demand in auto chip design, how it can help to choose the best implementation of functional safety approaches, and where it fits into the design flow. » read more

3 Safety Standards For Auto Electronics
By Ed Sperling - 13 Jan, 2020 - Comments: 0

Kurt Shuler, vice president of marketing at Arteris IP, drills down into the three main safety standards, ISO 26262, SOTIF (Safety of the Intended Function) and UL 4600, what each one covers, what the intent is behind them, and what this means for companies developing technology for future vehicles. » read more

Bridging Math And Engineering In ML
By Ed Sperling - 08 Jan, 2020 - Comments: 0

Steve Roddy, vice president of products for Arm’s Machine Learning Group, examines the intersection of high-level mathematics in the data science used in machine learning within area, speed, and power limitations, and how to bring these two worlds together with the least amount of disruption. » read more

Scan Diagnosis
By Ed Sperling - 20 Dec, 2019 - Comments: 1

Jayant D’Souza, product manager at Mentor, a Siemens Business, explains the difference between scan test and scan diagnosis, what causes values in a scan test to change, how this can be used to hone in on the actual cause of a failure in a design, and how to utilize test hardware more efficiently. » read more

Testing Autonomous Vehicles
By Ed Sperling - 16 Dec, 2019 - Comments: 0

Jeff Phillips, head of automotive marketing at National Instruments, talks about how to ensure that automotive systems are reliable and safe, how test needs to shift to adapt to continual updates and changes, and why this is particularly challenging in a world where there is no known right answer. » read more

How To Ensure Reliability
By Ed Sperling - 13 Dec, 2019 - Comments: 0

Michael Schuldenfrei, corporate technology fellow at OptimalPlus, talks about how to measure quality, why it’s essential to understand all of the possible variables in the testing process, and why outliers are no longer considered sufficient to ensure reliability. » read more

MLPerf Benchmarks
By Ed Sperling - 11 Dec, 2019 - Comments: 2

Geoff Tate, CEO of Flex Logix, talks about the new MLPerf benchmark, what’s missing from the benchmark, and which ones are relevant to edge inferencing. » read more

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