Why adaptive test is becoming necessary in heterogeneous designs.
Chiplets add a whole new challenge for the semiconductor industry. How much testing is enough? How do you optimize system binning? What’s the right amount of burn-in? The answers to these questions will vary, depending upon cost and quality tradeoffs, the number and source of the chiplets, and real-world workloads and projected lifespans. Marc Jacobs, senior director of solutions architecture at PDF Solutions, talks about the importance of collecting and analyzing data in heterogeneous designs, as well as the need to get it to the testers at the precise moment because not everything needs to be tested the same way.
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