A look at single and multiple die techniques for IoT design and verification.
Creating a sensor-based IoT edge device is challenging, due to the multiple design domains involved (Analog, digital, RF, and MEMS). But, creating an edge device that combines the electronics using the traditional CMOS IC flow and a MEMS sensor on the same silicon die can seem impossible. In fact, many IoT edge devices combine multiple dies in a single package, separating electronics from the MEMS design. The Tanner AMS IC design flow accommodates single or multiple die techniques for successful IoT edge device design and verification. This paper focuses on the unique challenge of fusing CMOS IC and MEMS design on a single die.
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