Maximize defect coverage with in-system non-destructive memory test, hybrid ATPG/Logic BIST and analog test coverage measurement.
As the industry moves towards greater automation in vehicles, suppliers of the ICs used to drive the automotive electronic systems are rapidly adopting solutions to meet ISO 26262 requirements. The Tessent family of IC test products offers the highest defect coverage, in-system non-destructive memory test, hybrid ATPG/Logic BIST, and analog test coverage measurement. These technologies add up to a comprehensive set of test solutions to address the quality and reliability metrics mandated by the ISO 26262 standard. This paper describes the advanced test capabilities for testing digital and analog portions of ICs for use in automotive applications.
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