Improving In-System Test With Tessent VersaPoint Test Point Technology


This paper describes a new versatile test point technology called VersaPoint, which has been developed specifically to work with designs implementing mixed EDT/LBIST methodologies to reduce EDT pattern counts and improve Logic BIST (LBIST) test coverage. VersaPoint test points can reduce compressed pattern counts 2X to 4X beyond compression alone and improve LBIST test coverage beyond what is p... » read more

Are Chips Getting More Reliable?


Reliability is emerging as a key metric in the semiconductor industry, alongside of power, performance and cost, but it also is becoming harder to measure and increasingly difficult to achieve. Most large semiconductor companies look at reliability in connection with consumer devices that last several years before they are replaced, but a big push into automotive, medical and industrial elec... » read more