Challenges and best practices for helping designers achieve optimal semiconductor quality, FuSa, reliability, and security.
The complexity of electronic systems supporting Advanced Driver Assistance Systems (ADAS), Highly Automated Driving (HAD), and in-vehicle infotainment is growing exponentially. This, together with the move from multiple domain-specific Electronic Control Units (ECUs) to a zonal architecture will require high-performance computing. Furthermore, new use cases for Battery Electric Vehicles (BEV) introduce design challenges to support more on-time than ever before. As a part of the VE-VIDES project, funded by the German Federal Ministry of Education and Research (BMBF), Synopsys and CARIAD have collaborated to outline a wide range of requirements for overcoming the challenges for today’s automotive semiconductor design and enable the four main aspects of semiconductor trustworthiness and dependability: quality, functional safety (FuSa), reliability, and security. This white paper highlights the outcome of the close collaboration between Synopsys and CARIAD/Audi and explains the challenges and best practices for helping designers achieve optimal semiconductor quality, FuSa, reliability, and security.
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