Multiphysics Reliability Signoff For Next-Generation Automotive Electronics Systems


Automotive electronics systems depend on an ever-increasing number of electronic sensors and processing elements, which allow for 360-degree surveillance and object identification/classification. Designing and verifying these systems is, however, as complex as the systems themselves. This white paper examines how automotive chip designers can achieve the stringent safety and reliability requ... » read more

Mitigating The Effects Of Radiation On Advanced Automotive ICs


The safety considerations in an automotive IC application have similarities to what is seen in other safety critical industries, such as the avionics, space, and industrial sectors. ISO 26262 is the state-of-the-art safety standard guiding the safety activities and work products required for electronics deployed in an automotive system. ISO 26262 requires that a design be protected from the eff... » read more

Automotive Gateway IP Enabling Scalable Automotive Platforms


As automakers introduce new electronic platforms, the system architectures are changing from distributed ECUs to integrated domain compute modules. This evolution, along with the increased number and types of sensors for ADAS systems, is having a big impact on the automotive Ethernet network and gateway function. Automotive Ethernet and gateways do more than support mobile connectivity, they en... » read more

How To Meet Functional Safety Requirements With Built-In-Self-Test


With the rapid growth in semiconductor content in today’s vehicles, IC designers need to improve their process of meeting functional safety requirements defined by the ISO 26262 standard. The ISO 26262 standard defines the levels of functional safety, known as Automotive Safety Integrity Level (ASIL), and is a mandatory part of an automotive system design process. The ASIL categories range... » read more

Four Steps To ISO 26262 Safety Mechanism Insertion And Validation


By Ping Yeung, Jin Hou, Vinayak Desai, and Jacob Wiltgen The complexity of automotive integrated circuits (ICs) has grown exponentially with the introduction of advanced driver-assistance systems and autonomous-drive technologies. Directly correlated to this hike in complexity is the increased burden of ensuring an IC is protected from random hardware faults—functional failures that occur ... » read more

CodaCache: Helping to Break the Memory Wall


As artificial intelligence (AI) and autonomous vehicle systems have grown in complexity, system performance needs have begun to conflict with latency and power consumption requirements. This dilemma is forcing semiconductor engineers to re-architect their system-on-chip (SoC) designs to provide more scalable levels of performance, flexibility, efficiency, and integration. From the edge to data ... » read more

Medical, Industrial & Aerospace IC Design Changes


Medical, industrial and aerospace chips are becoming much more complex as more intelligence is added into these devices, forcing design teams to begin leveraging tools and methodologies that typically have been used only at the leading-edge nodes for commercial applications. But as with automotive, the needs of these systems are changing quickly. In addition to strict quality, safety and sec... » read more

Standard Evolution


I recently had the opportunity to sit down with Lu Dai, chairman of Accellera Systems Initiative and senior director of engineering for Qualcomm. SE: I have noticed a change in the way that Accellera operates these days. In the past, standards were driven by the EDA companies, but recently we have seen a lot more end-user company involvement and they are the companies driving new standards. ... » read more

Speeding Up Verification Using SystemC


Brett Cline, senior vice president at OneSpin Solutions, explains how adding formal verification into the high-level synthesis flow can reduce the time spent in optimization and debug by about two-thirds, why this needs to be done well ahead of RTL, starting with issues such as initialization, memory out of bounds and other issues that are difficult to find in simulation. » read more

Improving Functional Safety For ICs


The exponential growth of electronics in automobiles have stimulated significant innovation towards the development of advanced safety mechanisms. In addition to very high-quality manufacturing test, ICs for safety-critical applications need in-system test to detect faults and monitor circuit aging. Scan-based logic built-in-self-test (LBIST) is the technique used for in-system test, but tradit... » read more

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