Improve scan chain diagnosis resolution by 4X.
For advanced technologies, the industry is seeing very complicated silicon defect types and defect distribution. One consequence is that scan chain diagnosis becomes more difficult. To improve the resolution of scan chain diagnosis, Tessent Diagnosis can use new scan chain test patterns to leverage a reversible scan chain architecture.
This paper describes the novel scan chain architecture that enables bi-directional shift operations during chain diagnosis and delves into the pattern generation needed to create a pattern set that allows diagnosis down to single cells. This new technology comprising scan chain design and diagnosis improves chain diagnosis resolution by 4X.
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