Scan Diagnosis


Jayant D’Souza, product manager at Mentor, a Siemens Business, explains the difference between scan test and scan diagnosis, what causes values in a scan test to change, how this can be used to hone in on the actual cause of a failure in a design, and how to utilize test hardware more efficiently. » read more

Scan Compression Is No Longer About Compression


Scan compression was introduced in the year 2000 and has seen rapid adoption. Nearly every design’s test methodology today implements this technology, which inserts compression logic in the scan path between the scan I/Os and the internal chains. In this article, we take a critical look at the technology to understand how scan compression has matured. The road to scan compression Since th... » read more