tag: analog

DAC Day Two: Down To Business
By Brian Bailey - 07 Jun, 2016 - Comments: 0

DAC day two started with a breakfast presentation put on by Synopsys which included guests from ARM, TSMC and HiSilicon. It was titled Collaborating to Enable Design with the latest processors and finFET processes. Collaboration is a word that we hear increasingly when talking about the advanced nodes and today we are truly at the point where one company cannot do it all. Ron Moore, VP of ma... » read more

Executive Insight: Lip-Bu Tan
By Ed Sperling - 06 Jun, 2016 - Comments: 0

Lip-Bu Tan, president and CEO of Cadence, opens up on the next big things, what will drive them, and what will change to make that happen. What follows are excerpts of that conversation. SE: What are the biggest changes in the semiconductor industry over the past year? Tan: The whole system approach to designing hardware and software is really happening now. It will continue to expand fr... » read more

Life on the Edge of IoT
By Jeff Miller - 02 Jun, 2016 - Comments: 0

The world on the edge of the IoT provides a rich microcosm to explore. While much of the attention paid to IoT is on big data applications in the cloud or the world of aggregating massive data provided by the real-world edge devices in the wild though cellphones and gateways, the edge devices themselves present a cornucopia of design challenges and exciting applications. Sensors and actuators m... » read more

Ray Zinn Reflects On 37 Years As CEO Of Micrel
By Brian Bailey - 26 May, 2016 - Comments: 0

Believed to be the longest serving CEO of any company to have existed in Silicon Valley, Ray Zinn does more in retirement than many people would accomplish as full time employees. While his name may not be at the top of most influential people in the valley, the industry may not be the same today had it not been for his contributions. Semiconductor Engineering spoke with him about his past, the... » read more

Pattern Matching in Design and Verification
By Michael White - 19 May, 2016 - Comments: 0

Pattern matching (PM) was first introduced as the semiconductor industry began to shift from simple one-dimensional rule checks to the two-dimensional checks required by sub-resolution lithography. These rule checks proved far more complex to write, hard to code for fast runtimes, and difficult to debug. Incorporating an automated visual capture and compare process enabled designers to define t... » read more

What’s The Outlook For ICs?
By Mark LaPedus - 19 May, 2016 - Comments: 1

As the semiconductor industry heads into the second half of 2016, it’s time to take the pulse of the IC sector. Based on the current signs, there’s a faint pulse, if that. Simply put, the IC market has been in the doldrums in the first half of 2016. And it looks sluggish heading into the second half. It wasn’t supposed to be like this. At the beginning of this year, many predicte... » read more

Wafer Shortage? Reality Versus Perception
By Joanne Itow - 19 May, 2016 - Comments: 0

The promise of explosive growth associated with IoT has semiconductor unit forecasts growing at double-digit rates for key product categories. Anything with the word ‘sensors’ seems to be in vogue today. Sensors, image sensors, sensor hubs are all expected to benefit from the billions of connected devices that are forecasted to be in place by 2020. Semico agrees. Unit growth for key product... » read more

End Of Mixed Signal Engineering?
By Ed Sperling - 04 May, 2016 - Comments: 1

EDA companies are stepping back after years of trying to force engineers to combine analog and digital disciplines. Rather than emphasizing [getkc id="38" kc_name="mixed signal"] as a single expertise, they are building bridges and translation mechanisms between the two worlds. The moves cap more than a decade of trying to find optimal ways to pack [getkc id="37" kc_name="analog"] and digita... » read more

Deep Space Design Considerations
By Nicolas Williams - 28 Apr, 2016 - Comments: 0

The linchpin technology in a deep space telescope is the ability to efficiently convert analog image sensor data into digital data in order to beam home high-resolution images of astronomical objects. The analog-to-digital converters (ADC) must perform flawlessly once deployed, because it is not feasible to drive out 1 million miles into space to fix any problems. The next-generation success... » read more

Plan-Based Analog Verification Methodology
By Cadence - 27 Apr, 2016 - Comments: 0

The ability to verify all the aspects of an analog design and to keep track of all the different verification tasks is a growing challenge. Manual attempts to do so often lead to mistakes since they rely on constantly updated documents. The Cadence Virtuoso ADE Verifier provides an overarching verification plan that links to all analog tests across multiple designers. The Virtuoso ADE Verifie... » read more

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