Evolving Edge Computing


Edge computing is a term that has been in use for a long time. Throughout the industry, there are many references to edge and many pre-conceptions about what that might mean. The term ‘edge’ is typically used for devices that exist on the edge of a network and can cover a plethora of use cases, ranging from the router in your house, a smart video camera surveying a parking lot, to a control... » read more

Blog Review: July 17


Cadence's Xin Mu explains the PCIe ECN Unordered IO (UIO) feature in the PCIe 6.1 specification, which defines a new wire semantic and related capabilities to enable multiple-path fabric support and helps avoid unnecessary traffic for better bandwidth and latency. Synopsys' Dana Neustadter, Gary Ruggles, and Richard Solomon highlight the latest updates in the CXL 3.1 standard, including new ... » read more

Intel Vs. Samsung Vs. TSMC


The three leading-edge foundries — Intel, Samsung, and TSMC — have started filling in some key pieces in their roadmaps, adding aggressive delivery dates for future generations of chip technology and setting the stage for significant improvements in performance with faster delivery time for custom designs. Unlike in the past, when a single industry roadmap dictated how to get to the next... » read more

Blog Review: July 10


Cadence's Paul Graykowski suggests using real number modeling to streamline digital mixed-signal verification using logic simulators and hardware emulators. Siemens' John McMillan and Microsoft's Amit Kumar introduce the basics of 3D-IC, describe the flow and data management challenges, look at the evolution of TSMC 3DBlox 1.0 and 2.0, and detail a physical verification and reliability analy... » read more

Chip Industry Week In Review


The Design Automation Conference morphed into the Chips to Systems Conference, reflecting an industry shift from monolithic SoCs to assemblies of chiplets in various flavors of advanced packaging. The change drew a slew of students and a resurgent buzz, fueled by discussions about heterogeneous integration, reliability, and ways to leverage AI/ML to speed up design and verification processes. ... » read more

Blog Review: June 26


Cadence's Neelabh Singh examines the Gen4 link recovery mechanism in USB4 Version 2.0, an autonomous process that is initiated by a router when it encounters uncorrectable error events, and identified verification challenges. Synopsys' Gary Ruggles and Priyank Shukla highlight improvements to PCIe 7.0 that will enable secure data transfers and boost bandwidth for the next generation of AI an... » read more

Moving Software-Defined Vehicles Forward


Experts at the Table: The automotive ecosystem is undergoing a transformation toward software-defined vehicles, spurring new architectures with more software. Semiconductor Engineering sat down to discuss the impact of these changes with Suraj Gajendra, vice president of products and solutions in Arm's automotive line of business; Chuck Alpert, R&D automotive fellow at Cadence; Steve Spadon... » read more

Blog Review: June 19


Siemens' John McMillan and Todd Burkholder suggest using an automatic formal-based approach to verifying chiplet package connections early in the design process. Cadence's Veena Parthan explores the intricacies of wind tunnel testing in automotive design and how the collaborative relationship between computational fluid dynamics (CFD) and wind tunnels has resulted in accelerated and more nua... » read more

IC Industry’s Growing Role In Sustainability


The massive power needs of AI systems are putting a spotlight on sustainability in the semiconductor ecosystem. The chip industry needs to be able to produce more efficient and lower-power semiconductors. But demands for increased processing speed are rising with the widespread use of large language models and the overall increase in the amount of data that needs to be processed. Gartner estima... » read more

Understanding Scandump: A Key Silicon Debugging Technique


Scandump is an advanced silicon debugging technique that ingeniously repurposes DFT (Design For Testability) scan chains for functional debugging. This method allows for the extraction of states from registers or latches that are stitched into the scan chains, providing critical diagnostic insights. Scandump is particularly invaluable when the CPU is deadlocked or when the system hardware bec... » read more

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