tag: data analytics

The Power Of Big Data: Or How To Make Perfect 30-Minute Brownies In Only 30 Minutes
By Mark Richards - 27 Jun, 2022 - Comments: 0

You're scrolling online, and the picture stops you in your tracks, grabs you, captivates you. Glistening chocolate pieces are, determinedly yet slowly, oozing down a moist brownie with a crisped-to-perfection, powdered topping. It sits there, confident, flaking lazily onto a bone-white china plate. It looks delicious—mouthwatering—and, apparently, you can make it with just a 30-minute inves... » read more

The Role Of AI And Endpoint Real-Time Data Analytics
By Kaushal Vora - 23 Jun, 2022 - Comments: 0

The Internet of Things (IoT) has the capability of amassing large amounts of data which it does with the help of dispersed intelligent sensors. The organization and distribution of this enormous amount of data is posing a challenge. While conventional methods of data analysis have facilitated the operations in IoT, artificial intelligence (AI) has proven that it can do it with greater precision... » read more

Active Learning: Integrating Natural Intelligence Into Artificial Intelligence
By Oliver Gnepper - 09 Jun, 2022 - Comments: 0

Today, very few people would likely deny the fact that data can present major added value for companies. But analyzing data from production processes reveals the incompleteness of data collection and the associated reduced potential of the data that can be leveraged. Typical shortcomings include: Incomplete representation of processes in the dataspace, Inadequate connection of processes... » read more

Trends In Testing: New Challenges Create New Opportunities
By Doug Lefever - 07 Jun, 2022 - Comments: 0

As advancements in semiconductors and microelectronics soldier ahead into emerging, even uncharted, territory, new test challenges arise. To that end, let’s look at a few key trends and challenges that are driving opportunities for innovation in the test sector. Technology convergence has been a buzzword for some time, and this trend is only going to intensify with the heightened need to m... » read more

Where And When End-to-End Analytics Works
By Anne Meixner - 10 May, 2022 - Comments: 0

With data exploding across all manufacturing steps, the promise of leveraging it from fab to field is beginning to pay off. Engineers are beginning to connect device data across manufacturing and test steps, making it possible to more easily achieve yield and quality goals at lower cost. The key is knowing which process knob will increase yield, which failures can be detected earlier, and wh... » read more

Harnessing The Power Of Data In Semiconductor Test
By Ken Butler - 10 May, 2022 - Comments: 0

Every day, new methods are being developed to harvest, cleanse, integrate, and analyze data sources and extract from them useful, actionable intelligence to aid decision-making and other processes. This is true for a variety of industries, including semiconductor design, manufacturing, and test. Moore’s Law (figure 1) may be slowing with respect to traditional scaling of transistor critica... » read more

If These Chips Could Talk: Actionable Insights From Path Margin Monitors
By Ash Patel - 14 Apr, 2022 - Comments: 0

One of the most important current trends in electronics is the gathering and analysis of big data to reap benefits in cost, power, performance, and reliability. This is becoming common in the chip development flow. For example, data harvested from simulation regressions can aid in debug and reaching coverage goals. Machine learning (ML) uses the results of many passes through implementation (lo... » read more

Finding And Applying Domain Expertise In IC Analytics
By Anne Meixner - 12 Apr, 2022 - Comments: 0

Behind PowerPoint slides depicting the data inputs and outputs of a data analytics platform belies the complexity, effort, and expertise that improve fab yield. With the tsunami of data collected for semiconductor devices, fabs need engineers with domain expertise to effectively manage the data and to correctly learn from the data. Naively analyzing a data set can lead to an uninteresting an... » read more

Extreme Ancestry: Silicon Edition
By Mike McIntyre - 11 Jan, 2022 - Comments: 0

The ability to trace the genealogy of all the components in an electronic device has been getting more complex for decades. For many industries — automotive, defense, medical and others — the need to locate the source of a problem in near real-time is paramount to gauging the extent of that problem. The extreme case is when the issue occurs with a product that already has been distributed a... » read more

Big Payback For Combining Different Types Of Fab Data
By Anne Meixner - 07 Dec, 2021 - Comments: 1

Collecting and combining diverse data types from different manufacturing processes can play a significant role in improving semiconductor yield, quality, and reliability, but making that happen requires integrating deep domain expertise from various different process steps and sifting through huge volumes of data scattered across a global supply chain. The semiconductor manufacturing IC data... » read more

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