Authors:
Finn de Ridder, ETH Zurich and VU Amsterdam; Pietro Frigo, Emanuele Vannacci, Herbert Bos, and Cristiano Giuffrida, VU Amsterdam; Kaveh Razavi, ETH Zurich
Abstract:
"Despite their in-DRAM Target Row Refresh (TRR) mitigations, some of the most recent DDR4 modules are still vulnerable to many-sided Rowhammer bit flips. While these bit flips are exploitable from native code, tri...
» read more