Winners And Losers At The Edge


The edge is a vast collection of niches tied to narrow vertical markets, and it is likely to stay that way for years to come. This is both good and bad for semiconductor companies, depending upon where they sit in the ecosystem and their ability to adapt to a constantly shifting landscape. Some segments will see continued or new growth, including EDA, manufacturing equipment, IP, security an... » read more

Challenges In Building Smarter Systems


Semiconductor Engineering sat down to define what the edge will look like with Jeff DeAngelis, managing director of the Industrial and Healthcare Business Unit at Maxim Integrated; Norman Chang, chief technologist at Ansys; Andrew Grant, senior director of artificial intelligence at Imagination Technologies; Thomas Ensergueix, senior director of the automotive and IoT line of business at Arm; V... » read more

Simplifying And Speeding Up Verification


Semiconductor Engineering sat down to discuss what's ahead for verification with Daniel Schostak, Arm fellow and verification architect; Ty Garibay, vice president of hardware engineering at Mythic; Balachandran Rajendran, CTO at Dell EMC; Saad Godil, director of applied deep learning research at Nvidia; Nasr Ullah, senior director of performance architecture at SiFive. What follows are excerpt... » read more

What’s Next With AI In Fabs?


Semiconductor Engineering sat down to discuss the issues and challenges with machine learning in semiconductor manufacturing with Kurt Ronse, director of the advanced lithography program at Imec; Yudong Hao, senior director of marketing at Onto Innovation; Romain Roux, data scientist at Mycronic; and Aki Fujimura, chief executive of D2S. What follows are excerpts of that conversation. Part one ... » read more

How And Where ML Is Being Used In IC Manufacturing


Semiconductor Engineering sat down to discuss the issues and challenges with machine learning in semiconductor manufacturing with Kurt Ronse, director of the advanced lithography program at Imec; Yudong Hao, senior director of marketing at Onto Innovation; Romain Roux, data scientist at Mycronic; and Aki Fujimura, chief executive of D2S. What follows are excerpts of that conversation. Part one ... » read more

What Machine Learning Can Do In Fabs


Semiconductor Engineering sat down to discuss the issues and challenges with machine learning in semiconductor manufacturing with Kurt Ronse, director of the advanced lithography program at Imec; Yudong Hao, senior director of marketing at Onto Innovation; Romain Roux, data scientist at Mycronic; and Aki Fujimura, chief executive of D2S. What follows are excerpts of that conversation. L-R:... » read more

Defect Image Classification And Detection With Deep Learning


Authors: Dan Sebban and Nissim Matatov Inspection means have increasingly been incorporated into typical manufacturing of boards, substrates and/or systems. A significant number of automatic inspections rely on the analysis of images that are acquired by a multitude of means such as optical, X-ray, infrared, acoustic microscopy. In contrast to automatic inspections, traditional visual inspec... » read more

The Challenges Of Building Inferencing Chips


Putting a trained algorithm to work in the field is creating a frenzy of activity across the chip world, spurring designs that range from purpose-built specialty processors and accelerators to more generalized extensions of existing and silicon-proven technologies. What's clear so far is that no single chip architecture has been deemed the go-to solution for inferencing. Machine learning is ... » read more

Hardware Attack Surface Widening


An expanding attack surface in hardware, coupled with increasing complexity inside and outside of chips, is making it far more difficult to secure systems against a variety of new and existing types of attacks. Security experts have been warning about the growing threat for some time, but it is being made worse by the need to gather data from more places and to process it with AI/ML/DL. So e... » read more

How To Ensure Reliability


Michael Schuldenfrei, corporate technology fellow at OptimalPlus, talks about how to measure quality, why it’s essential to understand all of the possible variables in the testing process, and why outliers are no longer considered sufficient to ensure reliability. » read more

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