A Lightweight Scan Instrumentation For Enhancing The Post-Silicon Test Efficiency in ICs (U. of Florida)


A technical paper titled "Enhancing Test Efficiency through Automated ATPG-Aware Lightweight Scan Instrumentation" was published by researchers at University of Florida. Abstract "Scan-based Design-for-Testability (DFT) measures are prevalent in modern digital integrated circuits to achieve high test quality at low hardware cost. With the advent of 3D heterogeneous integration and chiplet-b... » read more

Optimizing Data Movement


Demand for new and better AI models is creating an insatiable demand for more processing power and much better data throughput, but it's also creating a slew of new challenges for which there are not always good solutions. The key here is figuring out where bottlenecks might crop up in complex chips and advanced packages. This involves a clear understanding of how much bandwidth is required ... » read more