DTCO/STCO Create Path For Faster Yield Ramps


Higher density in planar SoCs and advanced packages, coupled with more complex interactions and dependencies between various components, are permitting systematic defects to escape traditional detection methods. These issues increasingly are not detected until the chips reach high-volume manufacturing, slowing the yield ramp and bumping up costs. To combat these problems, IDMs and systems co... » read more

Multi-Physics Combats Commoditization


The semiconductor industry has benefited greatly from developments around digital circuitry. Circuits have grown in size from a few logic gates in the 1980s to well over 1 billion today. In comparison, analog circuits have increased in size by a factor of 10. The primary reason is that digital logic managed to isolate many of the physical effects from functionality, and to provide abstractions ... » read more

Design For Reliability


By Arvind Shanmugavel Faster processors, lowered power targets and shrinking technology have increased the complexity of integrated circuit (IC) reliability analysis. With the 20nm node becoming mainstream, IC design teams are fast re-tooling their analysis methodologies to simulate and capture various reliability failure mechanisms. Electromigration (EM) analysis, thermal analysis and Electro... » read more

Making Quality A Top Priority in Next-Generation Designs


By Cheryl Ajluni With system design such a complicated task these days, it is increasingly likely that designers will inadvertently overlook some details of the design process, or worse yet, simply not have the time to address them adequately. Time is readily spent focusing on things like performance, area, timing, and power, but what about something a bit more esoteric in nature—namely, qu... » read more