SiC Growth For EVs Is Stressing Manufacturing


The electrification of vehicles is fueling demand for silicon carbide power ICs, but it also is creating challenges in finding and identifying defects in those chips. Coinciding with this is a growing awareness about just how immature SiC technology is and how much work still needs to be done — and how quickly that has to happen. Automakers are pushing heavily into electric vehicles, and t... » read more

Multivariate Analysis For Full Process Visibility


In semiconductor manufacturing, especially in electrical test data, but also in other parameters, there are often sets of parameters that are very highly correlated. Even a change in the correlation of those parameters may indicate a problem. For that reason, multivariate monitoring, or multivariate statistics, is applied to these parameters. Multivariate analysis, also known as multivariate... » read more

Ramping Up Power Electronics For EVs


The rapid acceleration of the power devices used in electric vehicles (EVs) is challenging chipmakers to adequately screen the ICs that power these vehicles.[1] While progress toward autonomous driving is grabbing the public’s attention, the electrification of transportation systems is progressing quietly. For the automotive industry, this shift involves a mix of electronic components. Amo... » read more

Pinpointing Timing Delays Can Improve Chip Reliability


Growing pressure to improve IC reliability in safety- and mission-critical applications is fueling demand for custom automated test pattern generation (ATPG) to detect small timing delays, and for chip telemetry circuits that can assess timing margin over a chip's lifetime. Knowing the timing margin in signal paths has become an essential component in that reliability. Timing relationships a... » read more

Preventing Process Excursion With AI And Yield Management Software


Process excursion, or any deviation in a certain process, significantly impacts the cost of semiconductor manufacturing process and product yield. During production, process excursion can be detected early during in-line inspections. However, in some cases, excursion isn’t detected until later in the production process such as during wafer testing in the probing area after production. Apar... » read more

Using AI To Improve Metrology Tooling


Virtual metrology is carefully being added into semiconductor manufacturing, where it is showing positive results, but the chip industry is proceeding cautiously. The first use of this technology has been for augmenting existing fab processes, such as advanced process control (APC). Controlling processes and managing yield generally do not require GPU processing and advanced algorithms, so t... » read more

What Is Achievable With A Yield Management System?


Semiconductor manufacturers are under constant pressure to increase yields and cut costs. Yield Management Systems (YMS) are designed specifically to meet the needs of semiconductor manufacturers, enabling them to investigate yield excursions, streamline the manufacturing processes, optimize the supply chain, analyze tools and eliminate workplace inefficiencies. In terms of data challenges... » read more

What Data Center Chipmakers Can Learn From Automotive


Automotive OEMs are demanding their semiconductor suppliers achieve a nearly unmeasurable target of 10 defective parts per billion (DPPB). Whether this is realistic remains to be seen, but systems companies are looking to emulate that level of quality for their data center SoCs. Building to that quality level is more expensive up front, although ultimately it can save costs versus having to ... » read more

Getting Smarter About Tool Maintenance


Chipmakers have begun to shift to predictive maintenance for process tools, but the hefty investment in analytics and engineering efforts means it will take some time for smart maintenance to become a widespread practice. Semiconductor manufacturers need to maintain a diverse set of equipment to process the flow of wafers, dies, packaged parts, and boards running through factories. OSAT and ... » read more

Integrating Siloed Data In Semiconductor Manufacturing


In semiconductor manufacturing, huge amounts of data are generated and collected at every step in multiple production areas, with data coming from wafer fab, probe/testing, assembly, and final test. That data is usually stored separately in its respective manufacturing department, isolated from other departments. In order to analyze the production data and make better decisions, yield an... » read more

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