Speeding Up Verification Using SystemC


Brett Cline, senior vice president at OneSpin Solutions, explains how adding formal verification into the high-level synthesis flow can reduce the time spent in optimization and debug by about two-thirds, why this needs to be done well ahead of RTL, starting with issues such as initialization, memory out of bounds and other issues that are difficult to find in simulation. » read more

Speeding Up FPGA Development


Salaheddin Hetalani, field application engineer at OneSpin Solutions, talks about why it’s getting harder to design and debug FPGAs, how much design time can be saved through formal techniques, and why just relying on programmability isn’t the most efficient approach. » read more

Reducing Power At RTL


Power management and reduction at the register transfer level is becoming more problematic as more heterogeneous elements are added into advanced designs and more components are dependent on interactions with other components. This has been a growing problem in leading-edge designs for the past couple of process nodes, but similar issues have begun creeping into less-sophisticated designs as... » read more

Ensuring Coverage In Large SoCs


Sven Beyer, product manager for design verification at OneSpin Solutions, talks about why formal technology is required to ensure coverage in some of the newest chips, how it deals with potential interactions and different use cases, and why it is gaining traction in automotive applications. » read more

Design For Airborne Electronics


The Next Generation Air Transportation System (NextGen), an FAA-led modernization of America's air transportation system meant to make flying more efficient, predictable and safer, is currently underway as one of the most ambitious infrastructure projects in U.S. history. This is not just a minor upgrade to an aging infrastructure. The FAA and partners are in the process of implementing new ... » read more

Making Sure RISC-V Designs Work As Expected


The RISC-V instruction set architecture is attracting attention across a wide swath of markets, but making sure devices based on the RISC-V ISA work as expected is proving as hard, if not harder, than other commercially available ISA-based chips. The general consensus is that open source lacks the safety net of commercially available IP and tools. Characterization tends to be generalized, ra... » read more

Big Design, IP and End Market Shifts In 2020


EDA is on a roll. Design starts are up significantly thanks to increased investment in areas such as AI, a plethora of new communications standards, buildout of the Cloud, the race toward autonomous driving and continued advancements in mobile phones. Many designs demand the latest technologies and push the limits of complexity. Low power is becoming more than just reducing wasted power at t... » read more

Uses And Limitations Of AI In Chip Design


Raik Brinkmann, president and CEO of OneSpin Solutions, sat down with Semiconductor Engineering to talk about AI changes and challenges, new opportunities for using existing technology to improve AI, and vice versa. What follows are excerpts of that conversation. SE: What's changing in AI? Brinkmann: There are a couple of big changes underway. One involves AI in functional safety, where y... » read more

Finding Hardware Trojans


John Hallman, product manager for trust and security at OneSpin Technologies, looks at how to identify hardware Trojans in a design, why IP from different vendors makes this more complicated, and how a digital twin can provide a reference point against which to measure if a design has been compromised. » read more

Transforming Silicon Bring-Up


Not too long ago, the return of first silicon from the foundry was a nail-biting moment as power was applied to the chip. Today, better verification methodologies, increased use of emulation, and more mature fabrication practices have transformed how teams utilize first silicon. It is about to be transformed again, and there are some interesting possibilities on the horizon. Much of what use... » read more

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