Finding Defects In Chips With Machine Learning


Chipmakers are using more and different traditional tool types than ever to find killer defects in advanced chips, but they are also turning to complementary solutions like advanced forms of machine learning to help solve the problem. A subset of artificial intelligence (AI), machine learning has been used in computing and other fields for decades. In fact, early forms of machine learning ha... » read more

Domain Expertise Becoming Essential For Analytics


Sensors are being added into everything, from end devices to the equipment used to make those sensors, but the data being generated has limited or no value unless it's accompanied by domain expertise. There are two main problems. One is how and where to process the vast amount of data being generated. Chip and system architectures are being revamped to pre-process more of that data closer to... » read more

Next Wave Of Security For IIoT


A rush of new products and services promise to make the famously un-secured Industrial IoT (IIoT) substantially more secure in the near future. Although the semiconductor industry has been churning out a variety of security-related products and concepts, ranging from root of trust approaches to crypto processors and physically unclonable functions, most IIoT operations have been slow to adop... » read more

System Bits: March 5


The new electronics field of magnonics Transistors keep shrinking to dimensions that are difficult to fabricate. There is doubt in the semiconductor industry about the possibility of producing 1-nanometer features with existing process technology. The answer may lie in magnonic currents: quasi-particles associated with waves of magnetization, or spin waves, in magnetic materials. Researcher... » read more

Week in Review: IoT, Security, Auto


Internet of Things Yingzi Technology of Guangzhou, China, has developed a “future pig farm” to demonstrate what technology can do to make keeping pigs more profitable in a country that is trying to reduce the number of small farms raising pigs and consolidate them into larger operations. China is also contending with an outbreak of African swine fever that has spread out of the country thr... » read more

Week In Review: Manufacturing, Test


Chipmakers and OEMs South Korean chipmaker MagnaChip reported its results. It has also undertaken a strategic evaluation of the company's foundry business and Fab 4, the larger of the company's two 200mm fabs. “The strategic evaluation is expected to include a range of possible options, including, but not limited to, joint ventures, strategic partnerships as well as M&A possibilities. The co... » read more

Blockchain May Be Overkill for Most IIoT Security


Blockchain crops up in many of the pitches for security software aimed at the industrial IoT. However, IIoT project owners, chipmakers and OEMs should stick with security options that address the low-level, device- and data-centered security of the IIoT itself, rather than the effort to promote blockchain as a security option as well as an audit tool. Only about 6% of Industrial IoT (IIoT) p... » read more

In-Memory Computing Challenges Come Into Focus


For the last several decades, gains in computing performance have come by processing larger volumes of data more quickly and with superior precision. Memory and storage space are measured in gigabytes and terabytes now, not kilobytes and megabytes. Processors operate on 64-bit rather than 8-bit chunks of data. And yet the semiconductor industry’s ability to create and collect high quality ... » read more

Manufacturing Bits: Feb. 5


Multi-beam litho shakeout The multi-beam e-beam market for lithography applications continues to undergo a shakeout amid technical roadblocks and other issues. Last week, ASML announced that it had acquired the intellectual-property (IP) assets of Mapper Lithography, a Dutch supplier of multi-beam e-beam tools for lithography applications that fell into bankruptcy late last year. As it t... » read more

Manufacturing Bits: Jan. 29


Thermal lithography Using a technique called thermal scanning probe lithography, New York University (NYU) and others have reported a breakthrough in fabricating 2D semiconductors. With the technology, researchers have devised metal electrodes with vanishing Schottky barriers on 2D semiconductors based on molybdenum disulfide (MoS₂). Thermal scanning probe lithography, sometimes called t-... » read more

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