tag: IBM

Blog Review: July 24
By Ed Sperling - 24 Jul, 2013 - Comments: 0

By Ed Sperling Mentor’s Harry Foster unleashes part six of the Wilson Research Group functional verification study, this segment digging deeper into the time spent in verification. The numbers have surpassed time spent on the design side, which either means the front-end tools are getting better or the verification problem is becoming more difficult. Cadence’s Brian Fuller interviews I... » read more

Experts At The Table: Who Pays For Low Power?
By Ed Sperling - 19 Jul, 2013 - Comments: 0

By Ed Sperling Low-Power/High-Performance Engineering sat down to discuss the cost of low power with Fadi Gebara, research staff member for IBM’s Austin Research Lab; David Pan, associate professor in the department of electrical and computer engineering at the University of Texas; Aveek Sarkar, vice president of product engineering and support at Apache Design; and Tim Whitfield, director o... » read more

GloFo Says 28nm FD-SOI Die Cost Much Less Than 28nm Bulk HPP
By Various Writers - 17 Jul, 2013 - Comments: 0

Posted by Adele Hars, Editor-in-Chief, Advanced Substrate News ~  ~ According to Shigeru Shimauchi, Country Manager, GlobalFoundries Japan, for the same level of performance, the die cost for 28nm FD-SOI will be substantially less than for 28nm bulk HPP (“high performance-plus”). Specifically, to get a 30%  increase in performance over 28nm bulk LPS PolySiON, HPP increases die ... » read more

Experts At The Table: Who Pays For Low Power?
By Ed Sperling - 11 Jul, 2013 - Comments: 0

By Ed Sperling Low-Power/High-Performance Engineering sat down to discuss the cost of low power with Fadi Gebara, research staff member for IBM’s Austin Research Lab; David Pan, associate professor in the department of electrical and computer engineering at the University of Texas; Aveek Sarkar, vice president of product engineering and support at Apache Design; and Tim Whitfield, director o... » read more

The Rise Of Semiconductor IP Subsystems
By Various Writers - 11 Jul, 2013 - Comments: 0

The semiconductor IP (SIP) market arose when SIP vendors created IP functions that mirrored those found in the discrete semiconductor market and made those functions available to SoC designers in the form of hard or soft SIP blocks. As the SoC and SIP markets evolved, it was a natural evolution that many discrete SIP functions be converged into larger blocks that mimic system-level functions (i... » read more

Memory Gets Smarter
By Ed Sperling - 27 Jun, 2013 - Comments: 0

By Ed Sperling Look inside any complex SoC these days and the wiring congestion around memory is almost astounding. While the number of features on a chip is increasing, they are all built around the same memory modules. Logic needs memory, and in a densely packed semiconductor, the wires that connect the myriad logic blocks are literally all over the memory. This is made worse by the fact ... » read more

Inside A 450mm Metrology Consortium
By Mark LaPedus - 20 Jun, 2013 - Comments: 0

By Mark LaPedus Semiconductor Manufacturing & Design sat down to discuss 450mm metrology challenges with Menachem Shoval, a former manufacturing executive at Intel and chairman of the Metro450 consortium. The Israeli-based consortium is developing metrology technology for the next-generation, 450mm wafer size. The group consists of Intel, Applied Materials, Jordan Valley, Nanomotion, Nov... » read more

Consortium Mania Sweeps 450mm Landscape
By Mark LaPedus - 20 Jun, 2013 - Comments: 0

By Mark LaPedus In the mid-1990s, the semiconductor industry embarked on a costly and problematic migration from 200mm to 300mm wafer fabs. At the time, the 300mm development efforts were in the hands of two groups—Sematech and a Japanese-led entity. The equipment industry was on the outside looking in. And as a result, the migration from 200mm to 300mm fabs was out of sync and a nightma... » read more

3D-IC Testing With The Mentor Graphics Tessent Platform
By Various Writers - 20 Jun, 2013 - Comments: 0

Three-dimensional stacked integrated circuits (3D-ICs) are composed of multiple stacked die, and are viewed as critical in helping the semiconductor industry keep pace with Moore's Law. Current integration and interconnect methods include wirebond and flip-chip and have been in production for some time. 3D chips connected via interposers are in production at Xilinx, Samsung, IBM, and Sematec... » read more

VLSI Kyoto – The SOI Papers
By Various Writers - 19 Jun, 2013 - Comments: 0

By Adele Hars There were some breakthrough FD-SOI and other excellent SOI-based papers that came out of the 2013 Symposia on VLSI Technology and Circuits in Kyoto (June 10-14, 2013). By way of explanation, VSLI comprises two symposia: one on Technology; one on Circuits. However, papers that are relevant to both were presented in “Jumbo Joint Focus” sessions.  The papers should all b... » read more

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