Week in Review: IoT, Security, Auto


Internet of Things AT&T reports the activation of its narrowband Internet of Things network in the U.S. The carrier upgraded its 4G LTE cell sites across the country. It now offers two low-power wide-area networks to business customers, including its LTE-M network in Mexico and the U.S. “Both networks are designed for the IoT within licensed spectrum and provide carrier-grade security,... » read more

Testing Analog Chips


The world of analog components is broad and diverse, and while testing analog chips may not take as long as running tests on complex SoCs, there are different requirements for analog devices. One type of chip that's seeing more application these days is analog microelectromechanical system devices. Automotive electronics call for a number of [getkc id="37" kc_name="analog"] chips, along with... » read more

Experts At The Table: Does 20nm Break System-Level Design?


By Ann Steffora Mutschler System-Level Design sat down to discuss design at 20nm with Drew Wingard, chief technology officer at Sonics; Kelvin Low, deputy director of product marketing at GlobalFoundries, Frank Schirrmeister, group director of product marketing for system development in the system and software realization group at Cadence; and Mike Gianfagna, vice president of marketing at At... » read more

Future Foundry Issues


Semiconductor Manufacturing & Design talks with Luigi Capodieci, fellow at GlobalFoundries, about EUV, the challenges at 20nm and beyond, and the future of the foundry model. [youtube vid=YXov4y0kpfU] » read more

The Future Of Manufacturing


Semiconductor Manufacturing & Design's Mark LaPedus talks with Randhir Thakur, general manager of Applied Materials' Silicon Systems Group, about what's changing in the foundries, in the equipment necessary to create ICs, and in the structures and materials used in those ICs. [youtube vid=y_b5G6J6UwU] » read more

New Reliability Issues


By Arvind Shanmugavel Reliability of ICs is a topic of growing concern with every technology node migration. With the onset of the 20nm process node from different foundries, reliability verification has taken center stage in design kits—and for good reason. Reliability margins have continued to decrease and have reached an inflection point at the 20nm node. The design and EDA communities ha... » read more