Fast And Accurate Variation-Aware Mixed-Signal Verification Of Time-Domain 2-Step ADC


To meet today’s analog-to-digital converter (ADC) specifications and to produce a high-yield design, teams typically need to perform extensive brute force mixed-signal simulations to account for all potential design variation. However, at nanometer nodes, the number of process, voltage and temperature (PVT) corners and parametric variation grow exponentially making the simulation impractical ... » read more

IC Test Solutions For The Automotive Market


The amount of electronic content in passenger cars continues to grow rapidly, driven mainly by the integration of various advanced safety features, which will increase further with the move towards fully autonomous vehicles. It is critical that these safety-related devices adhere to the highest possible quality and reliability requirements formalized in the ISO 26262 standard that is being rapi... » read more

Improving Test Coverage And Eliminating Test Ecapes Using Analog Defect Analysis


While the analog and mixed-signal components are the leading source of test escapes that result in field failures, the lack of tools to analyze the test coverage during design has made it difficult for designers to address the issue. In this white paper, we explore the methodology for performing analog fault simulation of test coverage based on defect-oriented testing. In addition, we look at h... » read more

More Multiply-Accumulate Operations Everywhere


Geoff Tate, CEO of Flex Logix, sat down with Semiconductor Engineering to talk about how to build programmable edge inferencing chips, embedded FPGAs, where the markets are developing for both, and how the picture will change over the next few years. SE: What do you have to think about when you're designing a programmable inferencing chip? Tate: With a traditional FPGA architecture you ha... » read more

From Constraints to Tape-Out: Towards A Continuous AMS Design Flow


The effort in designing analog/mixed-signal (AMS) integrated circuits is characterized by the largely manual work involved in the design of analog cells and their integration into the overall circuit. This inequality in effort between analog and digital cells increases with the use of modern, more complex technology nodes. To mitigate this problem, this paper presents four methods to improve ex... » read more

Improving Simulation Throughput Using The Xcelium Parallel Logic Simulator


Simulators have been around for a long time. First, there were interpreters in the ‘80s and ‘90s, and despite being relatively slow, they were a big step up from fabricating the design and hoping it worked. However, as designs continued to increase in size, the interpreters could not keep up with simulation needs, and innovation was required for simulators to keep pace with new technology. ... » read more

From Constraints To Tape-Out: Towards A Continuous AMS Design Flow


The effort in designing analog/mixed-signal (AMS) integrated circuits is characterized by the largely manual work involved in the design of analog cells and their integration into the overall circuit. This inequality in effort between analog and digital cells increases with the use of modern, more complex technology nodes. To mitigate this problem, this paper presents four methods to improve ex... » read more

Using Analog For AI


If the only tool you have is a hammer, everything looks like a nail. But development of artificial intelligence (AI) applications and the compute platforms for them may be overlooking an alternative technology—analog. The semiconductor industry has a firm understanding of digital electronics and has been very successful making it scale. It is predictable, has good yield, and while every de... » read more

ON Semiconductor Conquers Verification Challenges


Motor controller IC design for automotive applications, such as power mirror, seats, door locks, and door lift control, creates exceptional verification challenges. Particularly because these ICs must work for over 10 years and they live in harsh environments including -40° C to 150° C temperature ranges, voltages ranging from 7V to 40V, and potential electrostatic discharge and electromagnet... » read more

Boosting Analog Reliability


Aveek Sarkar, vice president of Synopsys’ Custom Compiler Group, talks about challenges with complex design rules, rigid design methodologies, and the gap between pre-layout and post-layout simulation at finFET nodes. https://youtu.be/JRYlYJ31LLw » read more

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