tag: Moortec

Why Analog Designs Fail
By Brian Bailey - 14 Feb, 2019 - Comments: 2

The gap between analog and digital reliability is growing, and digital designs appear to be winning. Reports show that analog content causes the most test failures and contributes significantly more than digital to field returns. The causes aren't always obvious, though. Some of it is due to the maturity of analog design and verification. While great strides have been made in digital circuit... » read more

Power Issues Rising For New Applications
By Ann Mutschler - 21 Jan, 2019 - Comments: 0

Managing power in chips is becoming more difficult across a wide range of applications and process nodes, forcing chipmakers and systems companies to rethink their power strategies and address problems much earlier than in the past. While power has long been a major focus in the mobile space, power-related issues now are spreading well beyond phones and laptop computers. There are several re... » read more

Process Variation And Aging
By Ann Mutschler - 17 Jan, 2019 - Comments: 0

Semiconductor Engineering sat down to discuss design reliability and circuit aging with João Geada, chief technologist for the semiconductor business unit at ANSYS; Hany Elhak, product management director, simulation and characterization in the custom IC and PCB group at Cadence; Christoph Sohrmann, advanced physical verification at Fraunhofer EAS; and Naseer Khan, vice president of sales at M... » read more

Tightening Margins On Heat
By Ed Sperling - 17 Jan, 2019 - Comments: 0

Stephen Crosher, CEO of Moortec, talks with Semiconductor Engineering about the impact of more accurate measurements on power, performance and reliability of designs from 40nm all the way down to 3nm. https://youtu.be/VnX-TiaMVmI » read more

Designing For Ultra-Low-Power IoT Devices
By Ann Mutschler - 19 Dec, 2018 - Comments: 1

Optimizing designs for power is becoming the top design challenge in battery-driven IoT devices, boxed in by a combination of requirements such as low cost, minimum performance and functionality, as well as the need for at least some of the circuits to be always on. Power optimization is growing even more complicated as AI inferencing moves from the data center to the edge. Even simple sens... » read more

Week In Review: Design, Low Power
By Jesse Allen - 14 Dec, 2018 - Comments: 0

The MIPI Alliance released MIPI I3C Basic v1.0, a subset of the MIPI I3C sensor interface specification that bundles 20 of the most commonly needed I3C features for developers and other standards organizations. The royalty-free specification includes backward compatibility with I2C, 12.5 MHz multi-drop bus that is over 12 times faster than I2C supports, in-band interrupts to allow slaves to not... » read more

4 Issues In Test
By Ed Sperling - 10 Dec, 2018 - Comments: 0

When most design engineers think about test, they envision a large piece of equipment in the fab they probably will never actually see or interact with. But as chips become more complex—driven by an explosion in both quantity and different types of data—test is emerging as one of the big challenges in design and manufacturing. There are four primary segments for test, each with its own s... » read more

Week In Review: Design, Low Power
By Jesse Allen - 30 Nov, 2018 - Comments: 0

Tools & IP UltraSoC debuted functional safety-focused Lockstep Monitor, a set of configurable IP blocks that are protocol aware and can be used to cross-check outputs, bus transactions, code execution, and register states between two or more redundant systems. It supports all common lockstep / redundancy architectures, including full dual-redundant lockstep, split/lock, master/checker, and... » read more

Week In Review: Design, Low Power
By Jesse Allen - 16 Nov, 2018 - Comments: 0

Tools & Standards Mentor uncorked a PCB design platform for non-specialist PCB engineers focused on multi-dimensional verification. The Xpedition platform can integrate a range of verification tools within a singular authoring environment, providing automatic model creation, concurrent simulation, cross probing from results, and error reviews to identify problems at the schematic or layout... » read more

Why Chips Die
By Brian Bailey - 12 Nov, 2018 - Comments: 4

Semiconductor devices contain hundreds of millions of transistors operating at extreme temperatures and in hostile environments, so it should come as no surprise that many of these devices fail to operate as expected or have a finite lifetime. Some devices never make it out of the lab and many others die in the fab. It is hoped that most devices released into products will survive until they be... » read more

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