By Pallab Chatterjee
With advanced process development occupying the 32nm to 22nm corridor, production SoC and ASIC designs are being built at the 180nm to 45nm nodes. In these processes, the designer has to contend with cross-wafer variation and non-correlated design corners, as well as multiple operation states. This is referred to as multi-corner multi-mode (MCMM) and variation analysis. ...
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