tag: National Instruments

Introduction To The NI mmWave Transceiver System Hardware
By NI - 10 Feb, 2020 - Comments: 0

Wireless technology is everywhere. Every day more and more new wireless devices are being created and accessing today’s wireless networks, consuming more and more data. The number of new wireless devices continues to escalate and the amount of data consumed continues to grow at an exponential rate. In order to address the demand, new wireless technologies are being investigated to evolve the ... » read more

Week In Review: Manufacturing, Test
By Mark LaPedus - 17 Jan, 2020 - Comments: 0

Fab tools, chips and technologies What happened at the SEMI Industry Strategy Symposium (ISS) this week? The annual three-day conference of executives gave the year’s first comprehensive outlook of the global electronics manufacturing industry. Click here to see the details. CyberOptics has unveiled its new WaferSense Auto Resistance Sensor (ARS) and its CyberSpectrum software. The produc... » read more

Week In Review: Design, Low Power
By Jesse Allen - 17 Jan, 2020 - Comments: 0

Inphi Corporation and Synopsys finalized the acquisition of eSilicon. Synopsys acquired certain IP assets from eSilicon, including TCAMs and multi-port memory compilers, as well as its Interface IP portfolio with High-Bandwidth Interface (HBI) IP and a team of R&D engineers; it did not disclose terms of the deal. Inphi Corporation bought the rest of the company for approximately $216 millio... » read more

Automakers Changing Tactics On Reliability
By Susan Rambo - 14 Jan, 2020 - Comments: 0

Automakers are beginning to rethink how to ensure automotive electronics will remain reliable over their projected lifetimes, focusing their efforts on redundancy, more data-centric architectures and continued testing throughout the life of a vehicle. It is still too early to really know how automotive chips actually will perform over the next 15 to 20 years, especially AI logic developed at... » read more

Advanced Features Of High-Speed Digital I/O Devices: Timing
By NI - 14 Jan, 2020 - Comments: 0

In digital communication, timing is the most essential element. Any kind of violation to timing could cause you to transmit or receive incorrect data. As instruments and communication rates get faster, timing becomes even more vital, as even the smallest of changes in edges (in the pico-second range), could cause incorrect tests and communication failures. In the following paragraphs, discover ... » read more

Better Object Arrangement In Block Diagrams
By Jon Soneson - 14 Jan, 2020 - Comments: 0

How many of you have spent countless hours and worn down your keyboard arrows cleaning up LabVIEW block diagrams? LabVIEW block diagrams help you move any object 1 pixel at a time. Though this feature gives you a lot of flexibility, it also makes arranging objects on a diagram extremely tedious. When designing the LabVIEW NXG diagram, we aimed to reduce the monotony of this task and make you mo... » read more

CEO Outlook: 2020 Vision
By Ed Sperling - 06 Jan, 2020 - Comments: 0

The start of 2020 is looking very different than the start of 2019. Markets that looked hazy at the start of 2019, such as 5G, are suddenly very much in focus. The glut of memory chips that dragged down the overall chip industry in 2019 has subsided. And a finely tuned supply chain that took decades to develop is splintering. A survey of CEOs from across the industry points to several common... » read more

Testing Autonomous Vehicles
By Ed Sperling - 16 Dec, 2019 - Comments: 0

Jeff Phillips, head of automotive marketing at National Instruments, talks about how to ensure that automotive systems are reliable and safe, how test needs to shift to adapt to continual updates and changes, and why this is particularly challenging in a world where there is no known right answer. » read more

The Growing Challenges Of 5G Reliability
By Susan Rambo - 10 Dec, 2019 - Comments: 0

The test field is getting more complicated as chips become larger, more heterogeneous, and subject to almost constant changes. Nowhere is this more evident than in 5G, where standards are still evolving and use cases are still being defined. Without passing test, no technology advances. But those definitions are subject to change, and they can change again over time. The communications in... » read more

Gaps Emerge In Test And Analytics
By Ed Sperling - 10 Dec, 2019 - Comments: 0

Sensor and process drift, increased design complexity, and continued optimization of circuitry throughout its lifetime are driving test and analytics in new directions, requiring a series of base comparisons against which equipment and processes can be measured. In the design world this type of platform is called a digital twin, but in the test world there is no equivalent today. And as more... » read more

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