tag: Optimal Plus

2.5D, FO-WLP Issues Come Into Focus
By Ann Mutschler - 10 Apr, 2017 - Comments: 2

Advanced packaging is beginning to take off after years of hype, spurred by 2.5D implementations in high-performance markets and fan-out wafer-level packaging for a wide array of applications. There are now more players viewing packaging as another frontier driving innovation. But perhaps a more telling sign is that large foundries in Taiwan have begun offering packaging services to customer... » read more

Data Leakage And The IIoT
By Ed Sperling - 22 Mar, 2017 - Comments: 1

The Internet of Things has raised concerns about people hacking into home networks or using armies of bots to disrupt communications. But with the Industrial IoT, the stakes are significantly higher—and the effects can last much longer. Security tops the list of concerns as more industrial equipment is connected to the Internet, according to numerous industry insiders. That hasn't stopped ... » read more

Quality Issues Widen
By Ed Sperling - 06 Mar, 2017 - Comments: 0

As the amount of semiconductor content in cars, medical and industrial applications increases, so does the concern about how long these devices will function properly—and what exactly that means. Quality is frequently a fuzzy concept. In mobile phones, problems have ranged from bad antenna placement, which resulted in batteries draining too quickly, to features that take too long to load. ... » read more

Outlier Detection
By Optimal Plus - 06 Feb, 2017 - Comments: 0

With increasing focus on quality and reliability across all segments beyond just automotive, medical and mil-aero, it is more critical than ever for companies to leverage every byte of test data at their disposal to ensure that they deliver the lowest possible DPPM (defective parts per million) rates to their customers. Semiconductor manufacturing operations now generate up to 100TB of test ... » read more

Betting On Wafer-Level Fan-Outs
By Ed Sperling - 06 Feb, 2017 - Comments: 2

Advanced packaging is starting to gain traction as a commercially viable business model rather than just one more possible option, propelled by the technical difficulties in routing signals at 10nm and 7nm and skyrocketing costs of device scaling on a single die. The inclusion of a [getkc id="202" kc_name="fan-out"] package for logic in Apple's iPhone 7, based on TSMC's Integrated Fan-Out (... » read more

CEO Outlook: Chip Design 2017
By Ed Sperling - 22 Dec, 2016 - Comments: 0

After two consecutive flat to slightly down years, the semiconductor industry is poised for growth in 2017. Cowan this month predicted 4.7% growth in semiconductor sales in 2017, while World Semiconductor Trade Statistics (WSTS) put that figure at 3.3%. And last month, International Business Strategies (IBS) pegged the number at 4.6%, according to statistics compiled by the Global Semiconduc... » read more

New Drivers For Test
By Brian Bailey - 28 Jul, 2016 - Comments: 0

Mention Design for Test (DFT) and scan chains come to mind, but there is much more to it than that—and the rules of the game are changing. New application areas such as automotive may breathe new life into built-in self-test (BIST) solutions, which could also be used for manufacturing test. So could DFT as we know it be a thing of the past? Or will it continue to have a role to play? Te... » read more

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