Margin Sensors In The Wild

Back in March, I wrote up an article here that looked at how a proxy circuit could be used to measure variations in circuit performance as conditions changed in the operating environment. There were a couple of recent presentations on margin sensors at two of the big EDA vendors' customer engineering forums that we’ll look at as well as another product with an upcoming presentation at DAC. Ma... » read more

SLM Analytics Of In-Chip Monitor Data Unlock Greater Productivity And Cost Savings

When it comes to measuring key operational metrics such as power and performance of your silicon, in-chip monitors have been the longstanding cornerstone for providing such valuable measurements and insights. Data captured from these monitors – process monitors configured in the form of ring oscillator chains being the most common – can tell you if your chip is meeting the requisite power o... » read more