Securing Chip Manufacturing Against Growing Cyber Threats


Semiconductor manufacturers are wrestling with how to secure a highly specialized and diverse global supply chain, particularly as the value of their IP and their dependence upon software increases — along with the sophistication and resources of the attackers. Where methodologies and standards do exist for security, they often are confusing, cumbersome, and incomplete. There are plenty of... » read more

Using ML For Improved Fab Scheduling


Expanding fab capacity is slow and expensive even under ideal circumstances. It has been still more difficult in recent years, as pandemic-related shortages have strained equipment supply chains. When integrated circuit demand rises faster than expansions can fill the gap, fabs try to find “hidden” capacity through improved operations. They hope that more efficient workflows will allow e... » read more

Automotive Innovations In Semiconductors


By Jeff Barnum, Janay Camp, and Cathy Perry Sullivan The semiconductor industry performed better than expected in 2020 despite the impact of COVID-19 on the global economy and is preparing for accelerated growth in 2021 and beyond. The global coronavirus pandemic significantly increased demand for communications electronics and fueled the growth in cloud computing to support remote work and ... » read more

Infrastructure Impacts Data Analytics


Semiconductor data analytics relies upon timely, error-free data from the manufacturing processes, but the IT infrastructure investment and engineering effort needed to deliver that data is, expensive, enormous, and still growing. The volume of data has ballooned at all points of data generation as equipment makers add more sensors into their tools, and as monitors are embedded into the chip... » read more

New Data Format Boosts Test Analytics


Demand for more and better data for test is driving a major standards effort, paving the way for one of most significant changes in data formats in years. There is good reason for this shift. Data from device testing is becoming a critical element in test program decisions regarding limits and flows. This is true for everything from automotive and medical components to complex, heterogeneous... » read more

Addressing IC Security Threats Before And After They Emerge


Semiconductor Engineering sat down to discuss different approaches to security with Warren Savage, research scientist in the Applied Research Laboratory for Intelligence and Security at the University of Maryland; Neeraj Paliwal, vice president and general manager of Rambus Security; Luis Ancajas, marketing director for IoT security software solutions at Micron; Doug Suerich, product evangelist... » read more

Determining What Really Needs To Be Secured In A Chip


Semiconductor Engineering sat down to discuss what's needed to secure hardware and why many previous approaches have been unsuccessful, with Warren Savage, research scientist in the Applied Research Laboratory for Intelligence and Security at the University of Maryland; Neeraj Paliwal, vice president and general manager of Rambus Security; Luis Ancajas, marketing director for IoT security softw... » read more

Security Risks In The Supply Chain


Semiconductor Engineering sat down to discuss security in the supply chain with Warren Savage, research scientist in the Applied Research Laboratory for Intelligence and Security at the University of Maryland; Neeraj Paliwal, vice president and general manager of Rambus Security; Luis Ancajas, marketing director for IoT security software solutions at Micron; Doug Suerich, product evangelist at ... » read more

Smart Manufacturing Initiative


SEMI’s Smart Manufacturing (SM) Initiative has been a gathering place for companies who believe that electronics manufacturing will benefit from the gathering and analysis of production and sensor data, and optimizing processes based on that data. SM principles are focused on increasing speed, improved output and higher quality. Smart Manufacturing relies on simplifying data sharing and co... » read more