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Adaptive NN-Based Root Cause Analysis in Volume Diagnosis for Yield Improvement


Abstract "Root Cause Analysis (RCA) is a critical technology for yield improvement in integrated circuit manufacture. Traditional RCA prefers unsupervised algorithms such as Expectation Maximization based on Bayesian models. However, these methods are severely limited by the weak predictive capability of statistical models and can’t effectively transfer the yield learning experience from old... » read more

RF GaN Gains Steam


The RF [getkc id="217" kc_name="gallium nitride"] (GaN) device market is heating up amid the need for more performance with better power densities in a range of systems, such as infrastructure equipment, missile defense and radar. On one front, for example, RF GaN is beginning to displace a silicon-based technology for the power amplifier sockets in today’s wireless base stations. GaN is m... » read more

Who Really Invented The Blue LED?


A dispute is simmering in the materials science community over the just-announced award of Nobel Prize in physics to three Japanese scientists, Isamu Akasaki, Hiroshi Amano, and Shuji Nakamura. Two materials science Ph.D. students from Stanford claim they got there first—two decades earlier, in fact. There's even a U.S. patent filed by Stanford University to prove it. Akasaki and Amano wor... » read more