tag: signal integrity

Maximizing Signal Integrity: Fine-Tuning Via Impedance In HDFO Architectures
By Tsung Ting Lee - 22 May, 2025 - Comments: 0

The most different aspect between a normal lamination structure and High-Density Fan-out (HDFO) is the routing scale. That aspect is also the challenge and focus of this study. At an HDFO scale, most of the electrical properties cannot be measured by instruments. Therefore, this study uses the indirect method to determine the impedance information of the via and match the impedance. Since the v... » read more

What Is Electronic Design Automation And Why Do You Need It?
By Roberto Piacentini Filho - 24 Apr, 2025 - Comments: 0

As data speeds push into the multi-gigabit range and requirements on digital systems grow more complex, cutting down the time-to-market while also ensuring error-free reliable designs seems impossible. Traditional design tools and practices can result in failed prototypes, costly respins, delayed time-to-market, missed market opportunities, and subpar performance. This is why advanced EDA to... » read more

Challenges of Chiplet Placement And Routing Optimization (KAIST)
By Technical Paper Link - 23 Apr, 2025 - Comments: 0

A new technical paper titled "Advanced Chiplet Placement and Routing Optimization considering Signal Integrity" was published by researchers at KAIST. Abstract: "This article addresses the critical challenges of chiplet placement and routing optimization in the era of advanced packaging and heterogeneous integration. We present a novel approach that formulates the problem as a signal integr... » read more

Accelerating SI/PI Signoff: A Shift-Left Approach to PCB Design
By Cadence - 23 Apr, 2025 - Comments: 0

In high-speed PCB design, late-stage signal integrity (SI) and power integrity (PI) issues can lead to costly redesigns and delays. This white paper explores how in-design analysis helps engineers catch and fix SI/PI challenges early, saving time, reducing risks, and ensuring first-pass success. What You’ll Learn: The Shift-Left Advantage – How early SI/PI analysis minimizes late-s... » read more

Co-Design Optimization For PI/SI When Considering Thermal Performance
By Peater Wu - 21 Apr, 2025 - Comments: 0

When applications become more complex, higher data rates or high frequencies are required. However, with increasing functions, more power dissipation will be generated. Furthermore, temperature is proportional to power dissipation, so electrical performance will also depend on thermal conditions. To determine how temperature impacts power integrity/signal integrity (PI/SI), electrical simulatio... » read more

Chiplets Add New Power Issues
By Ann Mutschler - 13 Mar, 2025 - Comments: 0

Delivering and managing power are becoming key challenges in the rollout of chiplets, adding significantly to design complexity and forcing chipmakers to weigh tradeoffs that can have a big impact on the performance, reliability, and the overall cost of semiconductors. Power is a concern for every chip and chiplet design, even if the specifics differ based on the application. Systems vendors... » read more

Signal Integrity Plays Increasingly Critical Role In Chiplet Design
By Ann Mutschler - 13 Feb, 2025 - Comments: 1

Maintaining the quality and reliability of electrical signals as they travel through interconnects is proving to be much more challenging with chiplets and advanced packaging than in monolithic SoCs and PCBs. Signal integrity is a fundamental requirement for all chips and systems, but it becomes more difficult with chiplets due to reflections, loss, crosstalk, process variation, and various ... » read more

Chiplet Interconnects Add Power And Signal Integrity Issues
By Adam Kovac - 12 Dec, 2024 - Comments: 0

The flexibility and scalability offered by chiplets make them an increasingly attractive choice over planar SoCs, but the rollout of increasingly heterogeneous assemblies adds a variety of new challenges around the processing and movement of data. Nearly all of the chiplets in use today were designed in-house by large systems companies and IDMs. Going forward, third-party chiplets will begin... » read more

Balancing Parallel Test Productivity With Yield & Cost
By Anne Meixner - 12 Nov, 2024 - Comments: 0

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring consistent test accuracy across multiple sites and reducing test time. Collectively, ATEs and multi-site test boards — DUT interface boards (DIBs), probe cards, and load boards — significantl... » read more

Managing Reflections With Terminations
By John Golding - 04 Nov, 2024 - Comments: 0

Have you heard recommendations to use a particular termination in particular situations for good signal integrity? Have you ever wondered how to incorporate terminations in your design? While there are typical use cases for various terminations, sometimes engineers use termination techniques based on a recommendation or assumption that may not work, or at least may not be optimal, for their par... » read more

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