Digital Twins Gaining Traction In Complex Designs


The integration of heterogeneous chiplets into an advanced package, coupled with the increasing digitalization of multiple industry segments, is pushing digital twins to the forefront of design. The challenge in these complex assemblies is figuring out the potential tradeoffs between different chiplets, different assembly approaches, and to be able to do it quickly enough to still hit market... » read more

Enabling 2.5D/3D Multi-Die Package


In the rapidly evolving world of ASIC design, the shift from monolithic to 2.5D and 3D multi-die architectures represents a significant leap forward. This approach, which integrates multiple chiplets (also knowns as dies) into a single package, demands not only a new level of IC design innovation but also an increased complexity in coordination and integration. At the forefront of this technolo... » read more

Accelerate Test Regressions with Synopsys VIP Using Dynamic Test Loading in VCS


Functional verification ensures that a design meets its specification requirements. The initial 80% of the verification process significantly impacts the time needed to complete the final 20%, which involves extensive test scenarios and regression testing, often consuming substantial engineering resources. Typically, the desired scenario emerges late in the test case, often in the last minutes ... » read more

Data Coherence Across Silos And Hierarchy


Shift left has become a rallying cry for the chip design industry, but unless coherent data can flow between the groups being impacted, the value may not be as great as expected. Shift left is a term that encompasses attempts to bring analysis and decision-making forward in the development process. The earlier an issue can be found, the less of a problem it ultimately becomes. But in many ca... » read more

Design Flow Challenged By 3D-IC Process, Thermal Variation


3D-ICs are proving a challenge even for designers accustomed to dealing with power and performance tradeoffs, but they are considered an inevitable migration path for leading-edge designs due to the compute demands of AI and the continual shrinking of digital logic. 3D-ICs are widely viewed as the way to continue scaling beyond the limits of planar SoCs, and a way to add more heterogeneous d... » read more

Blog Review: June 26


Cadence's Neelabh Singh examines the Gen4 link recovery mechanism in USB4 Version 2.0, an autonomous process that is initiated by a router when it encounters uncorrectable error events, and identified verification challenges. Synopsys' Gary Ruggles and Priyank Shukla highlight improvements to PCIe 7.0 that will enable secure data transfers and boost bandwidth for the next generation of AI an... » read more

Moving Software-Defined Vehicles Forward


Experts at the Table: The automotive ecosystem is undergoing a transformation toward software-defined vehicles, spurring new architectures with more software. Semiconductor Engineering sat down to discuss the impact of these changes with Suraj Gajendra, vice president of products and solutions in Arm's automotive line of business; Chuck Alpert, R&D automotive fellow at Cadence; Steve Spadon... » read more

Controlling Warpage In Advanced Packages


Warpage is becoming a serious concern in advanced packaging, where a heterogeneous mix of materials can cause uneven stress points during assembly and packaging, and under real workloads in the field. Warpage plays a critical role in determining whether an advanced package can be assembled successfully and meet long-term reliability targets. New advances, such as molding compounds with impro... » read more

Single Vs. Multi-Patterning Advancements For EUV


As semiconductor devices become more complex, so do the methods for patterning them. Ever-smaller features at each new node require continuous advancements in photolithography techniques and technologies. While the basic lithography process hasn’t changed since the founding of the industry — exposing light through a reticle onto a prepared silicon wafer — the techniques and technology ... » read more

Applying Machine Learning To Accelerate TCAD Calibration


TCAD models are the fundamental building blocks for the semiconductor industry. Whether it is a new process node or a new multi-billion dollar fab, accurate TCAD models must be developed and calibrated before they can be deployed in technology development. While TCAD models have been around for (many) decades, their complexity is growing exponentially, as is the demands placed on the R&D en... » read more

← Older posts Newer posts →