Blog Review: Feb. 21


Siemens' John McMillan digs into physical verification maturity for high-density advanced packaging (HDAP) designs and major differences in the LVS verification flow compared to the well-established process for SoCs. Synopsys' Varun Shah identifies why a cloud adoption framework is key to getting the most out of deploying EDA tools in the cloud, including by ensuring that different types of ... » read more

Why Chiplets Are So Critical In Automotive


Chiplets are gaining renewed attention in the automotive market, where increasing electrification and intense competition are forcing companies to accelerate their design and production schedules. Electrification has lit a fire under some of the biggest and best-known carmakers, which are struggling to remain competitive in the face of very short market windows and constantly changing requir... » read more

Impact Of 3DHI On Aerospace And Government Applications


By Ian Land, Kenneth Larsen, and Rob Aitken With challenging size, weight, and power (SWaP) requirements, chip designs for aerospace, defense, and government applications are a unique breed. No surprise here, considering systems like satellites and submarines must operate reliably in the distinctly harsh environments of outer space and ocean depths, respectively. Given the SWaP criteria a... » read more

AI Tradeoffs At The Edge


AI is impacting almost every application area imaginable, but increasingly it is moving from the data center to the edge, where larger amounts of data need to be processed much more quickly than in the past. This has set off a scramble for massive improvements in performance much closer to the source of data, but with a familiar set of caveats — it must use very little power, be affordable... » read more

Re-architecting Hardware For Energy


A lot of effort has gone into the power optimization of a system based on the RTL created, but that represents a small fraction of the possible power and energy that could be saved. The industry's desire to move to denser systems is being constrained by heat, so there is an increasing focus on re-architecting systems to reduce the energy consumed per useful function performed. Making signifi... » read more

SRAM Scaling Issues, And What Comes Next


The inability of SRAM to scale has challenged power and performance goals forcing the design ecosystem to come up with strategies that range from hardware innovations to re-thinking design layouts. At the same time, despite the age of its initial design and its current scaling limitations, SRAM has become the workhorse memory for AI. SRAM, and its slightly younger cousin DRAM, have always co... » read more

Blog Review: Feb. 14


Siemens’ Dilan Heredia and Karen Chow explain why fast, accurate parasitic extraction (PEX) is essential to design success, especially for the 3 nm node and GAAFETs. Synopsys’ Srinivas Velivala debunks the myth that layout-versus-schematic (LVS) checking is a static step in the chip development process, and details its evolving role in modern SoCs. Cadence’s Mark Seymour digs into a... » read more

Early Architecture Performance And Power Analysis Of Multi-Die Systems


A multi-die system is a semiconductor device in which multiple homogeneous or heterogeneous dies are contained within a single package. Multi-die systems have been available for select uses for years, but they are gaining wider popularity and are expected to be used in a wide variety of end applications, including high-performance computing, automotive, and mobile. There are two main factors dr... » read more

Chip Ecosystem Apprenticeships Help Close The Talent Gap


Competency-based apprenticeship programs are gaining wider acceptance across the chip industry as companies and governments look for new ways to address talent shortages, and as workers look for new skills that can span multiple industry sectors and industries. Funded in part by the CHIPS Act in the U.S. the European Chips Act, and various other nation-specific and regional programs, apprent... » read more

Adaptive Test Ramps For Data Intelligence Era


Widely available and nearly unlimited compute resources, coupled with the availability of sophisticated algorithms, are opening the door to adaptive testing. But the speed at which this testing approach is adopted will continue to vary due to persistent concerns about data sharing and the potential for IP theft and data leakage. Adaptive testing is all about making timely changes to a test p... » read more

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