tag: test

PCI Express Test Overview
By Keysight - 10 Apr, 2024 - Comments: 0

PCl Express, short for Peripheral Component Interconnect Express, is a high-performance and high-bandwidth serial communication interconnect standard. First proposed by Intel and further developed by the Peripheral Component Interconnect Special Interest Group (PCI-SIG) in replacement of bus-based communication architecture, such as PCI, PCI Extended (PCI-X), and Accelerated Graphics Port (AGP)... » read more

IC Test And Quality Requirements Drive New Collaboration
By Laura Peters - 09 Apr, 2024 - Comments: 0

Rapidly increasing chip and package complexity, coupled with an incessant demand for more reliability, has triggered a frenzy of alliances and working relationships that are starting to redefine how chips are tested and monitored. At the core of this shift is a growing recognition that no company can do everything, and that to work together will require much tighter integration of flows, met... » read more

Data Acquisition Software: The Brains Behind The Hardware
By Bernard Ang - 28 Mar, 2024 - Comments: 0

We have previously talked about how data acquisition systems streamline the testing of various test scenarios. However, the data acquisition (DAQ) hardware is just one-half of the equation. To make the hardware useful for various test scenarios, you need suitable data acquisition software and firmware that can take advantage of that powerful hardware and bridge the gap between your needs and... » read more

Effectively Monitor And Streamline Test Processes Using A DAQ
By Keysight - 13 Mar, 2024 - Comments: 0

Manufacturing and field operations generate a high volume of data, and they are also fueling growth in the use of smart remote sensing and the Industrial Internet of Things (IIoT). The data that is generated gives users visibility into their operations in real time or near real time to help them make decisions quickly. Time is a critical factor when high-volume production lines go down, electri... » read more

3D Connection Artifacts In PDN Measurements
By Cadence - 28 Feb, 2024 - Comments: 0

Authors: Ethan Koether, Amazon; Kristoffer Skytte, John Phillips, Shirin Farrahi, Cadence; Joseph Hartman, Oracle; Sammy Hindi, Ampere Computing Inc.; Mario Rotigni, STMicroelectronics; Gustavo Blando, Istvan Novak, Samtec From a simulation stand-point, we have covered several important topics that users must consider in detail to get accurate low frequency simulation results. We investigate... » read more

True Zero Trust Combats IC Manufacturing Security Challenges
By Michael Chang - 08 Feb, 2024 - Comments: 0

The semiconductor manufacturing industry is facing a host of unprecedented technology and security challenges. A common catchphrase these days is that “data is the new oil.” Data is everywhere, in everything we do, and there is both good and bad associated with this trend. Data everywhere creates new security issues that need to be addressed to protect the integrity of your information and ... » read more

AI-Driven Test Optimization Solves Semiconductor Test Costs And Design Schedules
By Sri Ganta - 08 Feb, 2024 - Comments: 0

Artificial Intelligence has become a pervasive technology that is being applied to solve today’s complex problems, especially in the areas involving exponentially large amounts of data, their analysis, and corresponding decision making that are otherwise limited by human abilities. Therefore, complex challenges in semiconductor design, test and manufacturing are a perfect match for AI. The... » read more

Partnership To Improve Semiconductor Quality And Yield
By Eli Roth - 08 Feb, 2024 - Comments: 0

By Eran Rousseau (NI) and Eli Roth (Teradyne) The semiconductor industry is notorious for its high production costs and the critical importance of maintaining impeccable product quality. As technology advances and consumer expectations rise, semiconductor companies face constant pressure to meet these cost and quality goals while also delivering cutting-edge products. Traditionally, the s... » read more

Wireless Trend Predictions For 2024 And Their Impact On The Test And Measurement Industry
By Niklas Nolemo - 09 Jan, 2024 - Comments: 0

The ever-evolving landscape of wireless technology continues to shape how we connect, communicate, and innovate. Connected systems continue to grow in complexity and reliance on one another which will impact the test & measurement industry significantly.  As we step into the year 2024, several key wireless trends are set to dominate the industry, ushering in a new era of connectivity and r... » read more

Meeting The Test Challenges Of Ultra-Wideband Chipsets
By Kevin Yan - 09 Jan, 2024 - Comments: 0

By Kevin Yan and Daniel Sun This article is adapted from a paper and presentation at SEMICON China, March 2023. Ultra-wideband (UWB) technology, as defined by IEEE 802.15.4 and 802.15.4z standards, enables short-range, low-power RF location-based services and wireless communication. A variety of devices have reached the market to help implement UWB capability, but these devices present si... » read more

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