tag: test

Device Validation: The Ultimate Test Frontier
By Dave Armstrong - 11 Apr, 2023 - Comments: 0

This article is a condensed version of an article that appeared in the November/December 2022 issue of Chip Scale Review. Adapted with permission. Read the original article at https://chipscalereview.com/wp-content/uploads/flipbook/30/book.html, p. 26. In the early days of space exploration, spacecraft were manned by small teams of astronauts, most of whom were experienced test pilots who ... » read more

Image Sensors Are Everywhere And The Implications For Test Are Significant
By Tom Chambers - 11 Apr, 2023 - Comments: 0

In February of 2021, the NASA Perseverance rover actively navigated a fully-autonomous entry and descent to successfully land in the Jezero Crater on Mars, using a brand-new navigational system developed by NASA – Terrain-Relative Navigation. The delay between mission control and the rover was about 11 minutes so a human-guided remote landing was not possible. Previous missions had to rely o... » read more

Adding Security Into Test
By Ed Sperling - 04 Apr, 2023 - Comments: 0

Security is becoming a much bigger concern as more electronics are added into cars, as more devices are connected to the internet, and as the value of data continues to increase. The problem is that security is dynamic. It continues to change throughout the lifetime of a system, and some of these devices are expected to last for a decade or more. Lee Harrison, director of Tessent product market... » read more

Rethinking Validation To Improve Products Quicker
By Kaitlynn Mazzarella - 23 Mar, 2023 - Comments: 0

By Kaitlynn Mazzarella and Marvin Landrum The boundaries of measurement science are being pushed more than ever before. Keeping up with evolving industry needs is not a simple feat. Not only does each new technology create business opportunities for companies to take share in new markets, but it also changes the way we design and test products. As the pace of technical innovation accelerates... » read more

PCIe 6.0 Electrical Testing For High Data-Bandwidth Applications
By Cadence - 22 Mar, 2023 - Comments: 0

For nearly three decades, PCI Express (PCIe) technology has been the standard interconnect inside computers providing high bandwidth and low latency to meet customer demand. However, as the industry needs to evolve, so does the standard, keeping pace and driving future innovation. PCIe 6.0 is ubiquitous and offers power-efficient performance and high bandwidth for latency-sensitive applicati... » read more

Revising 5G RF Calibration Procedures For RF IC Production Testing
By Vineet Pancholi - 16 Mar, 2023 - Comments: 0

Modern radio frequency (RF) components introduce many challenges to outsourced semiconductor assembly and test (OSAT) suppliers whose objective is to ensure products are assembled and tested to meet the product test specifications. The growing advancement and demand for RF products for cellphones, navigational instruments, global positioning systems, Wi-Fi, receiver/transmitter (Rx/Tx) componen... » read more

Test Challenges Mount As Demands For Reliability Increase
By Anne Meixner - 07 Mar, 2023 - Comments: 0

An emphasis of improving semiconductor quality is beginning to spread well beyond just data centers and automotive applications, where ICs play a role in mission- and safety-critical applications. But this focus on improved reliability is ratcheting up pressure throughout the test community, from lab to fab and into the field, in products where transistor density continues to grow — and wh... » read more

Advanced Digital Process Nodes Drive Semiconductor Test Innovations
By Regan Mills - 07 Mar, 2023 - Comments: 0

Global internet traffic is growing exponentially, with no sign of slowing, and this demand is driving the evolution of the semiconductor industry. The appetite for more and more data requires sensors for capturing the data, networks for moving the data, storage, and processing power to analyze the data. As the demand for data grows, the underlying technologies must advance to not only meet toda... » read more

Test Gets Ready For Wi-Fi 7
By Jan Ermert - 07 Mar, 2023 - Comments: 0

New test solutions are emerging to address the test challenges associated with the forthcoming Wi-Fi 7 standard. Wi-Fi 7 covers the (so far, for Wi-Fi) unused frequency range between 6 GHz and 7.125 GHz, using up to 4096-QAM modulation schemes and up to 320MHz channel bandwidth (see figure 1). Fig. 1: Wi-Fi band ranges are shown here, including the 3x increase in bandwidth enabled by a... » read more

AI: Engineering Tool Or Threat To Jobs?
By Ed Sperling - 02 Mar, 2023 - Comments: 0

Semiconductor Engineering sat down to talk about using AI for designing and testing complex chips with Michael Jackson, corporate vice president for R&D at Cadence; Joel Sumner, vice president of semiconductor and electronics engineering at National Instruments; Grace Yu, product and engineering manager at Meta; David Pan, professor in the Department of Electrical and Computer Engineering a... » read more

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