Darker Silicon


For the last several decades, integrated circuit manufacturers have focused their efforts on [getkc id="74" comment="Moore's Law"], increasing transistor density at constant cost. For much of that time, Dennard’s Law also held: As the dimensions of a device go down, so does power consumption. Smaller transistors ran faster, used less power, and cost less. As most readers already know, howe... » read more

Manufacturing Bits: May 13


Telling a FIB The National Institute of Standards and Technology (NIST) has built the first low-energy focused ion beam (FIB) microscope that uses a lithium ion source. Still in the R&D stage, the FIB microscope from NIST could be used to examine adjacent materials that are chemically different and identify the elements that make them up. The FIB microscope uses an ion source based on p... » read more

Newer posts →