A Holistic Approach To Yield Management


At yieldHUB we work with consultants and semiconductor experts, like André van de Geijn, semiconductor expert and author of Collaboratism. He supports our customers on the west coast of the US. We asked him about the benefits of various yield management solutions (YMS). In this article we will explain the benefits with insights from André. Today, people look at their current problem an... » read more

Process Window Discovery And Control


With the continued need for shrinking pattern dimensions, semiconductor manufacturers continue to implement more complex patterning techniques, such as advanced multi-patterning, for the 10nm design node and beyond. They also are investing significant development effort in readying EUV lithography for production at the 7/5nm design nodes. Additionally, semiconductor manufacturers’ use of desi... » read more

The Most Expensive Defect


Defect inspection tools can be expensive. But regardless of the cost of the inspection tool needed to find a defect, the fab is almost always better off financially if it can find and fix that defect inline versus at the end of line (e.g., electrical test and failure analysis). Here, we are referring to the term defect in a general sense—the same concepts also apply to metrology measurement... » read more