tag: YieldHub

5 Important Tips For Working With STDF
By yieldHUB - 12 May, 2020 - Comments: 0

The STDF datalog format developed by Teradyne has become the de facto standard in datalog formats in the semiconductor industry as most modern ATE manufacturers support the format. Data processing of the STDF files often require reading the binary files and converting them to formats that are human-readable or for input into a database. It is also possible that the STDF file is converted to ATD... » read more

Using Big Data For Yield And Reliability
By Ed Sperling - 22 Apr, 2020 - Comments: 0

John O’Donnell, CEO of yieldHUB, talks about the importance of clean data for traceability, yield improvement and device reliability, where and how it gets cleaned, and why that needs to be accompanied by domain expertise. » read more

Benefits And Drawbacks Of Working From Home
By Marie Ryan - 07 Apr, 2020 - Comments: 0

Many people are working home in recent weeks, due to the current Coronavirus (Covid-19) crisis.  At yieldHUB, a good number of us have worked remotely or from a home office for years. We have people working like this in Taiwan, the USA, the UK and Ireland. As well as that, our software system enables semiconductor engineers and their managers to work remotely or from home. There are many be... » read more

Reliability Challenges Grow For 5/3nm
By Ed Sperling And Susan Rambo - 07 Apr, 2020 - Comments: 0

Ensuring that chips will be reliable at 5nm and 3nm is becoming more difficult due to the introduction of new materials, new transistor structures, and the projected use of these chips in safety- and mission-critical applications. Each of these elements adds its own set of challenges, but they are being compounded by the fact that many of these chips will end up in advanced packages or modul... » read more

The Need For Traceability In Auto Chips
By Anne Meixner - 07 Apr, 2020 - Comments: 4

Someday your car will drive itself to a repair shop for a recall using a scheduling application that is both efficient and can prioritize which vehicles need to be fixed first. But that's still a ways off. Proactive identification of issues is not yet available. To be ready for that, today’s data analytics systems need to begin supporting targeted recalls, enabling predictive maintenance a... » read more

Test Costs Spiking
By Ed Sperling - 10 Mar, 2020 - Comments: 1

The cost of test is rising as a percentage of manufacturing costs, fueled by concerns about reliability of advanced-node designs in cars and data centers, as well as extended lifetimes for chips in those and other markets. For decades, test was limited to a flat 2% of total manufacturing cost, a formula developed prior to the turn of the Millennium after chipmakers and foundries saw the traj... » read more

What’s WAT? Testing At The End Of Manufacturing
By Marie Ryan - 10 Mar, 2020 - Comments: 0

The high costs of building, resourcing and operating a foundry fabricating integrated circuits are well known. Fabless companies avoid this capital cost and focus on design and innovation in their area of expertise. On the other hand, the fabless company relies on the expertise and skills of the foundry to produce quality wafers. Many times a process used by a fabless company to manufacture... » read more

Grading Chips For Longer Lifetimes
By Ed Sperling - 10 Mar, 2020 - Comments: 0

Figuring out how to grade chips is becoming much more difficult as these chips are used in applications where they are supposed to last for decades rather than just a couple of years. During manufacturing, semiconductors typically are run through a battery of tests involving performance and power, and then priced accordingly. But that is no longer a straightforward process for several reason... » read more

Blog Review: Feb. 12
By Ed Sperling - 12 Feb, 2020 - Comments: 0

Complexity is growing by process node, by end application, and in each design. The latest crop of blogs points to just how many dependencies and uncertainties exist today, and what the entire supply chain is doing about them. Mentor's Shivani Joshi digs into various types of constraints in PCBs. Cadence's Neelabh Singh examines the complexities of verifying a lane adapter state machine in... » read more

Logic Chip, Heal Thyself
By Susan Rambo And Ed Sperling - 11 Feb, 2020 - Comments: 0

If a single fault can kill a logic chip, that doesn’t bode well for longevity of complex multi-chip systems. Obsolescence in chips is not just an industry ploy to sell more chips. It is a fact of physics that chips don’t last more than a few years, especially if overheated, and hit with higher voltage than it can stand. The testing industry does a great job finding defects during manufac... » read more

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