System-Level Design
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Using CAA And DFM Scoring To Improve Manufacturing Success

Why critical area analysis is so critical to yield and quality.

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Critical area analysis and design for manufacturing scoring both offer designers actionable information they can use to improve their designs to prevent low-yield issues in the foundry. At the same time, they provide the foundry with information they can use for process improvement. Learn how fabless designers, foundries, and integrated device manufacturers can all benefit from addressing manufacturing susceptibilities in designs before tape-out to achieve the best results in both yield and product quality.

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