category: Test, Measurement and Analytics

category: IoT, Security & Automotive

The Importance Of Secure Data Sharing
By Mike McIntyre - 14 May, 2024 - Comments: 0

When it comes to data accessibility, the terms “secure” and “share” seem like two diametrically opposed words. Conventional wisdom would suggest that any effort to secure data would involve limiting access to that data, while sharing data would involve opening up access to that data for others to view and use. As it turns out, semiconductor operations need to do both. On the one h... » read more

Using Predictive Maintenance To Boost IC Manufacturing Efficiency
By Laura Peters - 14 May, 2024 - Comments: 0

Predicting exactly how and when a process tool is going to fail is a complex task, but it's getting a tad easier with the rollout of smart sensors, standard interfaces, and advanced data analytics. The potential benefits of predictive maintenance are enormous. Higher tool uptime correlates with greater fab efficiency and lower operating costs, so engineers are pursuing multiple routes to boo... » read more

Supporting Multiple Time Domains In SoC Production Test
By Hari Mani - 14 May, 2024 - Comments: 0

Complex system-on-chip (SoC) devices make every stage of the development flow harder, and the challenges continue even after the silicon is fabricated. Automatic test equipment (ATE) screening for defective wafers and assembled chips is always challenging. Production test engineers constantly struggle to minimize expensive test pattern memory, test each wafer or chip as quickly as possible, and... » read more

The Future Of Fault Coverage In Chips
By Gregory Haley - 14 May, 2024 - Comments: 0

Heterogeneous integration and sophisticated packaging are making chips more difficult to test, necessitating more versatile and efficient testing methods to minimize the time and cost it takes for each test insertion. In the past, test costs typically were limited to about 2% of the total cost of a chip. That cost has been rising in recent years, and with chiplets, advanced packaging, and mo... » read more

Advancing Product Performance Through Adaptable Production Test Equipment
By Michael Bryner - 14 May, 2024 - Comments: 0

Semiconductors are the backbone of modern electronics, powering everything from smartphones and laptops to autonomous vehicles and advanced medical equipment. As the semiconductor industry continues to push technological boundaries to deliver faster, smaller, and more powerful devices, ensuring the reliability and optimal performance of these components becomes increasingly challenging. A modu... » read more

Battery Management Testing: Alleviating EV Buyer Anxiety
By Thomas Koehler - 14 May, 2024 - Comments: 0

As the electric vehicle (EV) market surges towards 2040, fueled by strong consumer enthusiasm, the need to address key concerns about EV range, reliability, and battery life has become critical. Anxiety over potential range limitations, amplified by fears of scarce charging options, alongside safety worries due to media-reported battery incidents, have slowed adoption rates. Here, the semicondu... » read more

Using Deep Learning ADC For Defect Classification For Automatic Defect Inspection
By Onto Innovation - 14 May, 2024 - Comments: 0

In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is hard to avoid human errors when reviewing millions of defect images every day, and as a result, underkill or overkill of die can occur. Automatic defect classification (ADC) can reduce the number of... » read more

The Crucial Role Of High-Performance Computing In 2024: Balancing Cost And Innovation
By Keith Schaub - 14 May, 2024 - Comments: 0

We live in a world where digital queries run the Information Superhighway and in turn, our lives. This means that the importance of High-Performance Computing (HPC) cannot be overstated. The technology behind this continues to be a cornerstone for advancing our world and improving productivity. To put it another way, can you imagine a day, a week, when you are not querying something? So, let... » read more

Improvement of High-Gradation DDIC Device Test Yield By T6391 High-Accuracy Measurement Solution
By Advantest - 14 May, 2024 - Comments: 0

For DDIC (Display Driver IC) for OLED (Organic Light Emitting Diode) displays for smartphones and IT displays (tablets, laptops) and head mounted displays for AR (Augmented Reality)/VR (Virtual Reality), the output voltage will be divided into more highly-defined steps than in the past. A new per-pin digitizer and comparator module “LCD HP” was developed to measure the output voltage of the... » read more

Return On Investment Of A Pre-Reflow AOI System
By Nordson Test And Inspection - 14 May, 2024 - Comments: 0

This paper describes the losses from defects at the placement process in the SMT line. Two case studies of European and Taiwanese SMT manufacturers illustrate the actual losses from their defects. An evaluation method to select a pre-reflow AOI system maximizing the return on investment (ROI) is introduced. In the end, ROIs of three commercial pre-reflow AOI systems are compared to demonstrate ... » read more

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