August 2012 - Page 5 of 6 - Semiconductor Engineering

Mining For Data
By Ed Sperling - 09 Aug, 2012 - Comments: 0

By Ann Steffora Mutschler Power analysis accuracy at the RTL design abstraction is a challenging problem. Smaller geometries just make the challenge of predicting accurate RTL power consumption even more difficult, which in turn impacts other design decisions such as power-grid planning and package selection. “It’s one of these things where the earlier you are in the design, even befo... » read more

The New Frontier: Low-Power Verification And Test
By Ed Sperling - 09 Aug, 2012 - Comments: 0

By Ann Steffora Mutschler By now there’s no argument that verification and test strategies must be considered at the very earliest stages of any design cycle, and when it comes to low-power designs, the advanced techniques used and design complexity make the challenges here even more daunting. Low-power verification and test strategies have been in development for a number of years, and it... » read more

The Rise Of The Power Architect
By Ed Sperling - 09 Aug, 2012 - Comments: 0

By Ann Steffora Mutschler Call them power czars, power gurus or power architects, this role within design teams is gaining importance with the need to understand, manage and control the power budget throughout the entire design process. As such, power architects are in high demand today with power architecture teams doubling in size within a year or two. Driving the need for this highly s... » read more

The Easy Stuff Is Over
By Ed Sperling - 09 Aug, 2012 - Comments: 0

By Ed Sperling Doomsayers have been predicting the end of Moore’s Law for the better part of a decade. While it appears that it will still remain viable for some companies—Intel and IBM already are looking into single digits of nanometers and researchers speculating about picometer designs—for most companies the race is over. Progress will still be made in moving SoCs from one node to... » read more

An Automated Approach To RTL Memory BIST Insertion And Verification
By Various Writers - 09 Aug, 2012 - Comments: 0

ASIC vendors have been traditionally incorporating built-in self test (BIST) and repair solutions in their customers' gate level netlist. This used to be the common industry practice for technology nodes of 65 nm and older. Designers were comfortable writing in-house Perl scripts to replace memory instances with combined memory-BIST (MBIST) instances and make necessary connections. However, for... » read more

Preparing For 3DX
By Aveek Sarkar - 09 Aug, 2012 - Comments: 0

By Aveek Sarkar Undoubtedly we live in the age of mobility—smartphones, tablets, and ultra-books have transformed the way we work, live, and communicate. The worldwide smartphone market’s forecasted 24% CAGR, between 2010 and 2015 provides unique opportunities1. In emerging economies, more than 1 billion consumers are ready for the next new mobile platform2. Success in this market demands ... » read more

Meeting Emerging Needs For Next-Generation 3D-IC And Sub-20nm Designs
By Various Writers - 09 Aug, 2012 - Comments: 0

To remain competitive, IC designers must meet performance, power and price goals. However, these mutually conflicting goals require design techniques including 3D stacked-die architectures that will help meet performance and power targets by extending the integration capabilities beyond traditional SoC methodologies. To download this white paper, click here. » read more

AMD’s Bobcat Processor
By Barry Pangrle - 09 Aug, 2012 - Comments: 0

Barry Pangrle The International Symposium on Low Power Electronics and Design (ISLPED) was held last week in Redondo Beach, California. There were many good presentations and keynote addresses and a topic that’s near to my heart, near-threshold voltage computing, was often discussed along with how best to (or not) handle variability. One paper out of many that caught my attention was The ... » read more

Revisiting Moore’s Law
By Ed Sperling - 09 Aug, 2012 - Comments: 0

Moore’s Law was predicted to end at 1 micron. It was predicted to die off twice by Gordon Moore himself. And it has vacillated between 18 and 24 months on at least a couple of occasions since it was first introduced in 1965. From a technology perspective, there is no reason to assume it will ever die. It has gone from microns to nanometers and it can continue well into the picometer range.... » read more

RTL Power Reduction Triathlon
By Atrenta - 09 Aug, 2012 - Comments: 0

Unless you’ve just come out of a week-long coma, you’ve been watching at least part of the Olympic Games in London. The years of training, the drama of competition, the thrill of victory… (you know the rest). Some contests come down to the smallest of margins to define who wins gold. The recent women’s triathlon is one such case. After a 500-meter swim, a 43-kilometer bike ride and a 10... » read more

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