A novel universal deep learning model for segmentation of automated optical inspection images for both PCBA and semiconductor components.
A new technical paper titled “A Universal AI-Powered Segmentation Model for PCBA and Semiconductor” was published by researchers at Nordson Corporation.
“This paper introduces a novel universal deep learning model designed to segment AOI images for both PCBA and 17 semiconductor components, offering a more robust and adaptable solution for defect detection,” states the paper.
Read more here.
Authors:Charlie Zhu, Stephan Pirner, Srinivas Subramanian, Bahir Usanmaz, Robert Gray, Menghua Jiang, Brad Perkins, Robert Jung.
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