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Assessing & Simulating Semiconductor Side-Channel or Unintended Data Leakage Vulnerabilities

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This research paper titled “Multiphysics Simulation of EM Side-Channels from Silicon Backside with ML-based Auto-POI Identification” from researchers at Ansys, National Taiwan University and Kobe University won the best paper award at IEEE’s International Symposium on Hardware Oriented Security and Trust (HOST).

The paper presents a new tool “to assess unintended data leakage vulnerabilities while providing fast and predictively accurate simulation integration. Unintended data leakage includes vulnerabilities stemming from power consumption, electromagnetic emission, thermal emission, and other multiphysics phenomena,” according to this summary.

Find the technical paper here.



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