Where Is The Software For Shift Left?


Co-development of hardware and software has been a dream for a long time, but significant hurdles remain. Neither domain is ready with what the other requires at the appropriate time. The earlier something can be done in a development flow, the less likely problems will be found when they are more difficult or expensive to fix. It may require both tool and methodology changes, so that a proc... » read more

The Future Of AI For Games


Earlier this month, I had the pleasure of attending the inaugural AI and Games Conference at Goldsmiths in London, for which Arm was an associate sponsor. Hosted by Dr. Tommy Thompson, and borrowing its name from his AI and Games YouTube channel, the day really delivered on the promise of bringing experts and enthusiasts (and subscribers) together for interesting talks on the intersecti... » read more

Why Chips Fail, And What To Do About It


Experts at the Table: Semiconductor Engineering sat down to discuss reliability of chips in the context of safety- and mission-critical systems, as well as increasing utilization due to an explosion in AI data, with Steve Pateras, vice president of marketing and business development at Synopsys; Noam Brousard, vice president of solutions engineering at proteanTecs; Harry Foster, chief verificat... » read more

Deploying Generative AI At Scale With Flexibility And Speed


As the types of content that generative AI (GenAI) can process expands to advanced video, images, audio, and text, the race to innovate is creating new hurdles for developers. Discover how to overcome the challenges surrounding scalability and speed of GenAI development to offer cutting-edge experiences. Read more here and learn: How to run and scale GenAI workloads efficiently. Tech... » read more

Verifying SRAM Yield Inclusive Of Rare And Random Defects


Large disparities were observed between wafer level SRAM Access Disturb related bit-fails as measured on silicon wafers and the number of such bit-fails as predicted by intrinsic device variability alone. Root cause investigations pointed to a rare but random defect lowering threshold voltage of the NFET devices of the SRAM bit-cell. This work presents a novel method to enable the inclusion of ... » read more

Research Bits: Dec. 11


Photonic AI processor Researchers from Massachusetts Institute of Technology (MIT), Enosemi, and Periplous developed a fully integrated photonic processor that can perform all the key computations of a deep neural network optically on the chip. The chip is fabricated using commercial foundry processes and uses three layers of devices that perform linear and nonlinear operations. A particula... » read more

Automotive Design: How AI Is Transforming The Art Of Simulation


The automotive sector is about to experience a major wave of innovation as artificial intelligence (AI) is applied to design simulation, according to experts. The technology makes it possible to reduce the time needed to run the analyses for crash-test simulations — one of the most data-heavy exercises in automotive design — from several days to minutes. Read more here to learn about a p... » read more

Semiconductor Test Faces Technology Shifts In The AI Era


The surge in data-rich applications shows no signs of slowing down, fueling significant evolution within the global semiconductor industry. This insatiable demand for data necessitates a comprehensive ecosystem involving sensors and systems to capture data, networks to transmit it, and storage and processing power to analyze it. Successful deployment of these applications relies on the devel... » read more

Understanding Test Quality In Semiconductor Devices: An Overview


When it comes to semiconductor device testing, the primary goal is to ensure that each device meets functional and performance specifications. Testing also plays a crucial role in confirming that products will work as intended in real-world applications. However, defects in the manufacturing process can be a hindrance, making testing an essential step for quality assurance. Why test matters: F... » read more

Shift Left Strategy For Semiconductor Production Testing


In the fast-paced world of semiconductor manufacturing, achieving higher yields and reducing costs are constant challenges. Ideally, yield should only be impacted by unavoidable defects when everything else is performing as expected. However, when yield reduction occurs due to the process sensitivity of the design, these issues can be detected and, in many cases, corrected. proteanTecs has d... » read more

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