Looking Inside Of Chips
By Ed Sperling - 10 Jan, 2023 - Comments: 0

Shai Cohen, co-founder and CEO of proteanTecs, sat down with Semiconductor Engineering to talk about how to boost reliability and add resiliency into chips and advanced packaging. What follows are excerpts of that conversation. SE: Several years ago, no one was thinking about on-chip monitoring. What's changed? Cohen: Today it is obvious that a solution is needed for optimizing performanc... » read more

Achieving Greater Accuracy In Real-Time Vision Processing With Transformers
By Gordon Cooper - 10 Jan, 2023 - Comments: 0

Transformers, first proposed in a Google research paper in 2017, were initially designed for natural language processing (NLP) tasks. Recently, researchers applied transformers to vision applications and got interesting results. While previously, vision tasks had been dominated by convolutional neural networks (CNNs), transformers have proven surprisingly adaptable to vision tasks like image cl... » read more

Emerging Technologies Are Driving System Level Test Adoption
By Natalian Z. Der - 10 Jan, 2023 - Comments: 0

With the size of semiconductor transistors decreasing and chip complexity increasing exponentially, semiconductor test has become essential to ensuring that only high-quality products go to market. With the introduction of more rigorous acceptable quality level (AQL) certifications, test methods must constantly evolve to meet these standards, and system level test (SLT) and traditional test... » read more

Reducing Simulation Regression Turnaround Time With Dynamic Performance Optimization
By Synopsys - 10 Jan, 2023 - Comments: 0

No single step in the development of semiconductor devices is more sensitive to speed than functional simulation. A modern system-on-chip (SoC) design simulates billions of cycles of operation in the process of completing the verification plan and achieving coverage goals. To validate full system functionality, many of these simulations include running code on one or more embedded processors. E... » read more

IR Laser Imaging Is Rapidly Changing IR Microscopy
By Bruker - 10 Jan, 2023 - Comments: 0

IR laser imaging is finally being commercialized into smart analytical equipment. New applications continue to emerge and yield massive advantages, thanks to the direct combination with FT-IR technology. The application notes below provide valuable insights into three applications of IR laser imaging: Tissue imaging Surface analysis Forensic science Click here to read more. » read more

Industrial Solutions For Machine-Learning-Enabled Yield Optimization And Test
By Sonny Banwari - 10 Jan, 2023 - Comments: 0

This article summarizes the content of a paper developed and presented by Advantest at ETS 2022. By Sonny Banwari and Matthias Sauer According to market research firm Gartner, Inc., in assessing the completion rate of data science projects, as well as the bottom-line value they generate for their companies, only between 15 and 20 percent of these projects are ever completed. Moreover, of ... » read more

System Level Test — A Primer: White Paper
By Teradyne - 10 Jan, 2023 - Comments: 0

As semiconductor geometries become smaller and greater complexity is pushed into chips or packages, System Level Test (SLT) is becoming essential. Peter Reichert, System Architect for Teradyne’s System Level Test division discusses what System Level Test is, and how it can improve final product quality and reduce time to market. Click here to download the white paper. » read more

Choosing The Right Memory At The Edge
By Ed Sperling - 09 Jan, 2023 - Comments: 0

As the amount of data produced by sensors in cars and phones continues to grow, more of that data needs to be processed locally. It takes too much time and power to send it all to the cloud. But choosing the right memory for a particular application requires a series of tradeoffs involving cost, bandwidth, power, which can vary greatly by device, application, and even the data itself. Frank Fer... » read more

Automated Late Stage Timing-Aware Dynamic Voltage Drop ECO
By Manoj Chacko - 09 Jan, 2023 - Comments: 0

One of the never-ending frustrations for electrical engineers is having to deal with counterproductive real-world effects that they wish would just go away. Examples include switch bounce, metastability, and contact resistance. For IC designers, dynamic voltage drop (DVD), also known as IR drop, is one of those unfortunate facts of the profession. There’s no way to avoid it; every trace and w... » read more

Research Bits: Jan. 9
By Jesse Allen - 09 Jan, 2023 - Comments: 0

Making stretchy semiconductors Researchers from Pennsylvania State University, University of Houston, Purdue University, and Texas Heart Institute developed a new method to make soft, stretchable transistors easier and cheaper to manufacture. The lateral phase separation induced micromesh (LPSM) process involves mixing a semiconductor and an elastomer and spin coating the liquid mixture pre... » read more

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