category: Blogs – PTES

category: IoT, Security & Automotive

Testing The Stack: DFT Is Ready For 3D Devices
By Martin Keim - 08 Sep, 2022 - Comments: 0

When existing advanced 2D designs already push the limits of design-for-test (DFT) tools, what hope do developers have of managing DFT for 3D devices? Can anyone afford the tool run time, on-chip area demand, pattern count, and test time? The answer, from an array of experts, is yes, there is a path to a scalable, affordable, and comprehensive DFT solution for 3D ICs. Well-covered strategies... » read more

Plasma Dicing 101: The Basics
By Richard Barnett - 15 Aug, 2022 - Comments: 0

Taking place at the end of the semiconductor process flow, dicing is the process where the silicon wafer is finally turned into individual chips, or die, traditionally by means of a saw or laser. A saw blade, or laser, is used to cut the wafer along the areas between the chips called dicing lanes. This step separates the chips from the wafer making them ready to be packaged and fitted to whiche... » read more

Sky High: More Thoughts To Consider Before Transitioning To The Cloud
By Miki Banatwala - 09 Aug, 2022 - Comments: 0

In our previous blog, I talked about the essential factors that a company must consider in leveraging cloud resources to accelerate their goals. The objective here is not just about putting some of the workload in the cloud; rather, it is about realizing the transformation adopting cloud technologies will bring about. In particular, it is more important to think of the cloud not only as a set o... » read more

Are You Leaving Performance On The Table? Here Is One Sure Way To Find Out
By Nozar Nozarian - 09 Aug, 2022 - Comments: 0

Compute platforms are always hungry for more performance. This is a fact that we simply cannot escape. Whether you are targeting high performance computing, IoT, mobile, or the automotive market, you need to unlock the best performance for your specific workloads. This relentless quest for performance comes with an unwelcome side effect: system complexity. As hardware becomes more capable, the ... » read more

The Great Migration To 5G Is Underway
By David Vondran - 09 Aug, 2022 - Comments: 0

Every decade brings with it a plethora of technology changes, and the cumulative effects of 50+ years of changes in wireless technologies are noteworthy for how they have changed the way we communicate. The 80’s began the era of personal computing along with 1G rollout The 90’s saw the advent of 64-bit microprocessor architecture in consumer devices coinciding with 2G rollout The... » read more

Up And Away: Clear-Eyed Considerations For Your Cloud-Adoption Journey
By Miki Banatwala - 12 Jul, 2022 - Comments: 0

It’s no secret the cloud is a driving force powering the digital transformation. However, cloud adoption is rarely a one-size-fits-all operation. Even when done correctly, it can bring about company-wide transformations unique to each organization. At the very core, the move to the cloud is akin to a culture change, and understanding these changes can make the transition successful. The follo... » read more

Minimizing Execution Risk In Test Solution Development
By David Ducrocq - 12 Jul, 2022 - Comments: 0

Test development projects are a mix of engineering disciplines with a complex and interdependent ecosystem. The ability to assess risks and their impact on the entire project can be the difference between success and failure. A technical project lead provides a single point of responsibility for assessing technical risk across the project, developing mitigation plans, and driving countermeasure... » read more

Leverage Functional Interfaces For High-Speed Test Access During All Phases Of The Silicon Lifecycle
By Ash Patel - 12 Jul, 2022 - Comments: 0

Chip testing used to be straightforward. The development team used fault simulation to select a subset of the functional tests that could detect most possible manufacturing faults. These were translated to test patterns that ran on automated test equipment (ATE) to screen out defective dies at wafer test and bad packaged chips in final test. Lots of new technology was introduced over time, incl... » read more

Chip Data Joins The Party
By Richard Oxland - 12 Jul, 2022 - Comments: 0

Perhaps you’ve heard of silicon lifecycle management (product lifecycle management for your semiconductor) but considered it a “far-future” practice that you can safely ignore for now. While many pieces of a complete silicon lifecycle solutions (SLS) are not yet in place, the components are coming together every day. Today, in fact, Siemens’ Tessent offers a new suite of software ser... » read more

Are Tiny MicroLEDs The Next Big Thing For Displays?
By Carolyn Short - 08 Jun, 2022 - Comments: 1

One of the latest emerging trends is a renewed focus on microLED technology. What is a microLED, and why is the industry focusing on this technology? As the name suggests, a microLED, or µLED, is a light-emitting diode (LED) – roughly 100 times smaller than conventional LEDs. MicroLEDs can be arranged into arrays to make high-resolution displays for applications ranging from smartwatches... » read more

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