category: Blogs – PTES

category: IoT, Security & Automotive

Improving Functional Safety For ICs
By Mohammed Abdelwahid - 10 Mar, 2020 - Comments: 0

The exponential growth of electronics in automobiles have stimulated significant innovation towards the development of advanced safety mechanisms. In addition to very high-quality manufacturing test, ICs for safety-critical applications need in-system test to detect faults and monitor circuit aging. Scan-based logic built-in-self-test (LBIST) is the technique used for in-system test, but tradit... » read more

What’s WAT? Testing At The End Of Manufacturing
By Marie Ryan - 10 Mar, 2020 - Comments: 0

The high costs of building, resourcing and operating a foundry fabricating integrated circuits are well known. Fabless companies avoid this capital cost and focus on design and innovation in their area of expertise. On the other hand, the fabless company relies on the expertise and skills of the foundry to produce quality wafers. Many times a process used by a fabless company to manufacture... » read more

Manufacturing Optimization With Digital Thread
By Michael Schuldenfrei - 10 Mar, 2020 - Comments: 0

Data is everywhere, and if you know what to do with it, can be tremendously valuable. Huge volumes of data are collected in manufacturing industries across the supply chain, with the help of technologies such as IoT platforms, sensors, and edge devices. However, data is only as good as the value extracted from it, and getting the most out of data is challenging. Because information is often con... » read more

Wafer Test Challenges For Chiplets
By Amy Leong - 10 Mar, 2020 - Comments: 0

In a heterogeneous integrated system, the impact of composite yield fallout due to a single chiplet is creating new performance imperatives for wafer test in terms of test complexity and coverage. From a test perspective, making chiplets a mainstream technology depends on ensuring Good Enough Die at a reasonable test cost. Wafer-level test plays a critical and intricate role in the chipl... » read more

Extreme Quality Semiconductor Manufacturing
By Ben Tsai - 11 Feb, 2020 - Comments: 0

By Ben Tsai and Cathy Perry Sullivan Across the full range of semiconductor device types and design nodes, there is a drive to produce chips with significantly higher quality. Automotive, IoT and other industrial applications require chips that achieve very high reliability over a long period of time, and some of these chips must maintain reliable performance while operating in an environmen... » read more

Using Machine Learning To Gain Data Insights
By Alex Burlak - 11 Feb, 2020 - Comments: 0

Today’s consumers have little appetite for networks that go down, for electronic devices that fail, and for any kind of digital service that doesn’t deliver as promised every time. Reliability is no longer a nice-to-have. It's  a key feature. The continued scaling of advanced electronics and chip manufacturing technologies, however, makes reliability harder to achieve — even as expectati... » read more

An Optimal Path To DFT Automation
By Jay Jahangiri - 11 Feb, 2020 - Comments: 0

To keep up with time-to-market demands when SoCs keep increasing in size and complexity requires the adoption of better DFT flows and technologies. One of the most successful changes in design-for-test (DFT) flows in recent years has been the deployment of hierarchical DFT. Taking the divide-and-conquer approach delivers real savings in test time and cost, plus keeps DFT out of the critical pat... » read more

Extreme Quality Semiconductor Manufacturing, Part 1: Automotive
By Ben Tsai - 14 Jan, 2020 - Comments: 0

By Ben Tsai and Cathy Perry Sullivan Across the full range of semiconductor device types and design nodes, there is a drive to produce chips with significantly higher quality. Automotive, IoT and other industrial applications require chips that achieve very high reliability over a long period of time, and some of these chips must maintain reliable performance while operating in an environmen... » read more

Planning Ahead For In-System Test Of Automotive ICs
By Jeff Mayer - 14 Jan, 2020 - Comments: 0

Automobiles are increasingly more like electronic devices than mechanical platforms. As a share of the total cost of a car, electronics components have grown from about 5% in 1970 to 35% in 2010. Electronics are projected to account for 50% by 2030 (Deloitte, 2019). Some of the electronics are for passive operations, like display or In-Vehicle Infotainment (IVI) systems, but a growing proportio... » read more

The Impact Of Test Engineers
By Marie Ryan - 14 Jan, 2020 - Comments: 0

As testing is at the end of each project, it’s often seen as a non-value-added necessity that just needs to be done. This is why Test Engineers often feel overlooked and undervalued. Previously, we explained why engineering managers should value their test engineers, and told them how to get the most out of their teams. Today we’ll explore how test engineers can learn to understand the... » read more

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